Solution-Processed Gallium–Tin-Based Oxide Semiconductors for Thin-Film Transistors
We investigated the effects of gallium (Ga) and tin (Sn) compositions on the structural and chemical properties of Ga–Sn-mixed (Ga:Sn) oxide films and the electrical properties of Ga:Sn oxide thin-film transistors (TFTs). The thermogravimetric analysis results indicate that solution-processed oxide...
Main Authors: | Xue Zhang, Hyeonju Lee, Jungwon Kim, Eui-Jik Kim, Jaehoon Park |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2017-12-01
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Series: | Materials |
Subjects: | |
Online Access: | https://www.mdpi.com/1996-1944/11/1/46 |
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