Integrated SiGe Detectors for Si Photonic Sensor Platforms
In this work, we present the results of integrated Ge detectors grown on a Si photonic platform for sensing applications. The detectors are fabricated on a passive photonic circuit for maximum coupling efficiency. Measurement results at 1300 nm wavelength show a responsivity of 0.2 A/W and very low...
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doaj-6cb30f49b51b48c497f26dfd354413df2020-11-25T00:33:39ZengMDPI AGProceedings2504-39002017-08-011455910.3390/proceedings1040559proceedings1040559Integrated SiGe Detectors for Si Photonic Sensor PlatformsGrégory Pandraud0Silvana Milosavljevic1Amir Sammak2Matteo Cherchi3Aleksandar Jovic4Pasqualina Sarro5Else Kooi Laboratory, TU Delft, Feldmannweg 17, 2628 CT, Delft, The NetherlandsElse Kooi Laboratory, TU Delft, Feldmannweg 17, 2628 CT, Delft, The NetherlandsQutech, TU Delft, Van der Waalsweg 122, 2628, Delft, The NetherlandsVTT Technical Research Center of Finland, P.O. Box 1000, FI-02044 VTT, Finland, Espoo, FinlandElectronic Components Technology and Materials, TU Delft, Mekelweg 4, 2628 CD, Delft, The NetherlandsElectronic Components Technology and Materials, TU Delft, Mekelweg 4, 2628 CD, Delft, The NetherlandsIn this work, we present the results of integrated Ge detectors grown on a Si photonic platform for sensing applications. The detectors are fabricated on a passive photonic circuit for maximum coupling efficiency. Measurement results at 1300 nm wavelength show a responsivity of 0.2 A/W and very low dark current levels. For a voltage range between 0 and −10 V, the dark current is better than 0.1 nA which is crucial for highly sensitivity devices and applications, like Optical Coherence Tomography.https://www.mdpi.com/2504-3900/1/4/559Si photonicsSiGe detectorsoptical coherence tomography |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Grégory Pandraud Silvana Milosavljevic Amir Sammak Matteo Cherchi Aleksandar Jovic Pasqualina Sarro |
spellingShingle |
Grégory Pandraud Silvana Milosavljevic Amir Sammak Matteo Cherchi Aleksandar Jovic Pasqualina Sarro Integrated SiGe Detectors for Si Photonic Sensor Platforms Proceedings Si photonics SiGe detectors optical coherence tomography |
author_facet |
Grégory Pandraud Silvana Milosavljevic Amir Sammak Matteo Cherchi Aleksandar Jovic Pasqualina Sarro |
author_sort |
Grégory Pandraud |
title |
Integrated SiGe Detectors for Si Photonic Sensor Platforms |
title_short |
Integrated SiGe Detectors for Si Photonic Sensor Platforms |
title_full |
Integrated SiGe Detectors for Si Photonic Sensor Platforms |
title_fullStr |
Integrated SiGe Detectors for Si Photonic Sensor Platforms |
title_full_unstemmed |
Integrated SiGe Detectors for Si Photonic Sensor Platforms |
title_sort |
integrated sige detectors for si photonic sensor platforms |
publisher |
MDPI AG |
series |
Proceedings |
issn |
2504-3900 |
publishDate |
2017-08-01 |
description |
In this work, we present the results of integrated Ge detectors grown on a Si photonic platform for sensing applications. The detectors are fabricated on a passive photonic circuit for maximum coupling efficiency. Measurement results at 1300 nm wavelength show a responsivity of 0.2 A/W and very low dark current levels. For a voltage range between 0 and −10 V, the dark current is better than 0.1 nA which is crucial for highly sensitivity devices and applications, like Optical Coherence Tomography. |
topic |
Si photonics SiGe detectors optical coherence tomography |
url |
https://www.mdpi.com/2504-3900/1/4/559 |
work_keys_str_mv |
AT gregorypandraud integratedsigedetectorsforsiphotonicsensorplatforms AT silvanamilosavljevic integratedsigedetectorsforsiphotonicsensorplatforms AT amirsammak integratedsigedetectorsforsiphotonicsensorplatforms AT matteocherchi integratedsigedetectorsforsiphotonicsensorplatforms AT aleksandarjovic integratedsigedetectorsforsiphotonicsensorplatforms AT pasqualinasarro integratedsigedetectorsforsiphotonicsensorplatforms |
_version_ |
1725315576636637184 |