SET Pulse Characterization and SER Estimation in Combinational Logic with Placement and Multiple Transient Faults Considerations

SET Pulse Characterization and SER Estimation in Combinational Logic with Placement and Multiple Transient Faults Considerations

Integrated circuit susceptibility to radiation-induced faults remains a major reliability concern. The continuous downscaling of device feature size and the reduction in supply voltage in CMOS technology tend to worsen the problem. Thus, the evaluation of Soft Error Rate (SER) in the presence of mul...

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Bibliographic Details
Main Authors: Georgios Ioannis Paliaroutis, Pelopidas Tsoumanis, Nestor Evmorfopoulos, George Dimitriou, Georgios I. Stamoulis
Format: Article
Language:English
Published: MDPI AG 2020-01-01
Series:Technologies
Subjects:
characterization
masking effects
fan-out variation
temperature variation
voltage variation
multiple transient faults
sensitive gates
soft error rate
susceptibility
Online Access:https://www.mdpi.com/2227-7080/8/1/5

Internet

https://www.mdpi.com/2227-7080/8/1/5

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