Strain effects on polycrystalline germanium thin films

Abstract Polycrystalline Ge thin films have attracted increasing attention because their hole mobilities exceed those of single-crystal Si wafers, while the process temperature is low. In this study, we investigate the strain effects on the crystal and electrical properties of polycrystalline Ge lay...

Full description

Bibliographic Details
Main Authors: Toshifumi Imajo, Takashi Suemasu, Kaoru Toko
Format: Article
Language:English
Published: Nature Publishing Group 2021-04-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-021-87616-x

Similar Items