Hyperspectral photoluminescence imaging of defects in solar cells
The present work is a demonstration of how near infrared (NIR) hyperspectral photoluminescence imaging can be used to detect defects in silicon wafers and solar cells. Chemometric analysis techniques such as multivariate curve resolution (MCR) and partial least squares discriminant analysis (PLS-DA)...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IM Publications Open
2016-12-01
|
| Series: | Journal of Spectral Imaging |
| Subjects: | |
| Online Access: | https://www.impublications.com/download.php?code=I05_a8 |