Study of crystallographic, optical and sensing properties of Na2WO4 films deposited by thermal evaporation with several thickness
Na2WO4 films have been grown at 400 °C using thermal evaporation technique. Their structural properties were characterized by XRD, while their chemical composition was verified by both EDX and X-ray photoelectron spectroscopy (XPS). The evolution of crystallinity was studied as a function of film th...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Sciendo
2019-12-01
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| Series: | Materials Science-Poland |
| Subjects: | |
| Online Access: | https://doi.org/10.2478/msp-2019-0080 |