Direct evaluation method to measure permittivity and conductivity of thin layers via wave approach in the THz region
The direct evaluation method for measuring the permittivity and conductivity of thin layers was proposed via the wave approach in the terahertz (THz) region. The terahertz time-domain spectroscopy (THz-TDS) was employed for performing experiments with thin dielectric layers. The proposed method take...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2019-11-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5115092 |