Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI

Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI

Prognostic of electronic device under vibration condition can help to get information to assist in condition-based maintenance and reduce life-cycle cost. A prognostic and remaining life prediction method for electronic devices under random vibration condition is proposed. Vibration response is meas...

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Main Authors: Ying Chen, Ning Tang, Zenghui Yuan
Format: Article
Language:English
Published: Hindawi Limited 2016-01-01
Series:Shock and Vibration
Online Access:http://dx.doi.org/10.1155/2016/2650569
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spelling doaj-64fe4f44826e4fc0899254db05390c1b2020-11-24T21:30:00ZengHindawi LimitedShock and Vibration1070-96221875-92032016-01-01201610.1155/2016/26505692650569Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPIYing Chen0Ning Tang1Zenghui Yuan2Science and Technology on Reliability and Environmental Engineering Laboratory, Reliability and System Engineering Department, Beihang University, Beijing 100191, ChinaScience and Technology on Reliability and Environmental Engineering Laboratory, Reliability and System Engineering Department, Beihang University, Beijing 100191, ChinaScience and Technology on Reliability and Environmental Engineering Laboratory, Reliability and System Engineering Department, Beihang University, Beijing 100191, ChinaPrognostic of electronic device under vibration condition can help to get information to assist in condition-based maintenance and reduce life-cycle cost. A prognostic and remaining life prediction method for electronic devices under random vibration condition is proposed. Vibration response is measured and monitored with acceleration sensor and OMA parameters, including vibration resonance frequency, especially first-order resonance frequency, and damping ratio is calculated with cross-power spectrum density (CPSD) method and modal parameter identification (MPI) algorithm. Steinberg vibration fatigue model which considers transmissibility factor is used to predict the remaining life of electronic component. Case study with a test board is carried out and remaining life is predicted. Results show that with this method the vibration response characteristic can be monitored and predicted.http://dx.doi.org/10.1155/2016/2650569
collection DOAJ
language English
format Article
sources DOAJ
author Ying Chen
Ning Tang
Zenghui Yuan
spellingShingle Ying Chen
Ning Tang
Zenghui Yuan
Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI
Shock and Vibration
author_facet Ying Chen
Ning Tang
Zenghui Yuan
author_sort Ying Chen
title Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI
title_short Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI
title_full Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI
title_fullStr Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI
title_full_unstemmed Prognostic and Remaining Life Prediction of Electronic Device under Vibration Condition Based on CPSD of MPI
title_sort prognostic and remaining life prediction of electronic device under vibration condition based on cpsd of mpi
publisher Hindawi Limited
series Shock and Vibration
issn 1070-9622
1875-9203
publishDate 2016-01-01
description Prognostic of electronic device under vibration condition can help to get information to assist in condition-based maintenance and reduce life-cycle cost. A prognostic and remaining life prediction method for electronic devices under random vibration condition is proposed. Vibration response is measured and monitored with acceleration sensor and OMA parameters, including vibration resonance frequency, especially first-order resonance frequency, and damping ratio is calculated with cross-power spectrum density (CPSD) method and modal parameter identification (MPI) algorithm. Steinberg vibration fatigue model which considers transmissibility factor is used to predict the remaining life of electronic component. Case study with a test board is carried out and remaining life is predicted. Results show that with this method the vibration response characteristic can be monitored and predicted.
url http://dx.doi.org/10.1155/2016/2650569
work_keys_str_mv AT yingchen prognosticandremaininglifepredictionofelectronicdeviceundervibrationconditionbasedoncpsdofmpi
AT ningtang prognosticandremaininglifepredictionofelectronicdeviceundervibrationconditionbasedoncpsdofmpi
AT zenghuiyuan prognosticandremaininglifepredictionofelectronicdeviceundervibrationconditionbasedoncpsdofmpi
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