Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C
We studied the surface reaction between metallic In and a single-crystal GaAs substrate at 400–600 °C induced by the improved sessile drop method. Studying the surface morphology and microstructure using scanning electron microscopy, we found that many large particles had formed on the GaAs substrat...
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Online Access: | http://dx.doi.org/10.1063/1.4985133 |
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doaj-641cb5ee836e45ab90982b46e83550612020-11-24T23:45:04ZengAIP Publishing LLCAIP Advances2158-32262017-06-0176065003065003-610.1063/1.4985133007706ADVSynthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °CLiang Zhao0Xiangdong Ding1Jingjuan Li2Shen Yang3Lei Zhao4Zuoxing Guo5Key Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaState Key Lab for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, People’s Republic of ChinaKey Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaKey Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaKey Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaKey Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaWe studied the surface reaction between metallic In and a single-crystal GaAs substrate at 400–600 °C induced by the improved sessile drop method. Studying the surface morphology and microstructure using scanning electron microscopy, we found that many large particles had formed on the GaAs substrate, indicating a violent reaction between the In and GaAs. This reaction became more violent with increasing temperature. Characterizing the generated phases by X-ray diffraction and transmission electron microscopy, we identified the particles as InxGa1−xAs compounds. Our results show that indium (In) reacted with single-crystal GaAs through this method to form InxGa1−xAs compounds. Moreover, during the synthesis of InxGa1−xAs by the sessile drop method, the molten In and GaAs exhibited wettability at 400–600 °C. This experiment lays the foundation for synthesizing InxGa1−xAs compounds only using the metal In and GaAs substrate by a simple method.http://dx.doi.org/10.1063/1.4985133 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Liang Zhao Xiangdong Ding Jingjuan Li Shen Yang Lei Zhao Zuoxing Guo |
spellingShingle |
Liang Zhao Xiangdong Ding Jingjuan Li Shen Yang Lei Zhao Zuoxing Guo Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C AIP Advances |
author_facet |
Liang Zhao Xiangdong Ding Jingjuan Li Shen Yang Lei Zhao Zuoxing Guo |
author_sort |
Liang Zhao |
title |
Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C |
title_short |
Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C |
title_full |
Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C |
title_fullStr |
Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C |
title_full_unstemmed |
Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C |
title_sort |
synthesizing inxga1−xas using molten in and gaas by the sessile drop method at 400–600 °c |
publisher |
AIP Publishing LLC |
series |
AIP Advances |
issn |
2158-3226 |
publishDate |
2017-06-01 |
description |
We studied the surface reaction between metallic In and a single-crystal GaAs substrate at 400–600 °C induced by the improved sessile drop method. Studying the surface morphology and microstructure using scanning electron microscopy, we found that many large particles had formed on the GaAs substrate, indicating a violent reaction between the In and GaAs. This reaction became more violent with increasing temperature. Characterizing the generated phases by X-ray diffraction and transmission electron microscopy, we identified the particles as InxGa1−xAs compounds. Our results show that indium (In) reacted with single-crystal GaAs through this method to form InxGa1−xAs compounds. Moreover, during the synthesis of InxGa1−xAs by the sessile drop method, the molten In and GaAs exhibited wettability at 400–600 °C. This experiment lays the foundation for synthesizing InxGa1−xAs compounds only using the metal In and GaAs substrate by a simple method. |
url |
http://dx.doi.org/10.1063/1.4985133 |
work_keys_str_mv |
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