Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C

We studied the surface reaction between metallic In and a single-crystal GaAs substrate at 400–600 °C induced by the improved sessile drop method. Studying the surface morphology and microstructure using scanning electron microscopy, we found that many large particles had formed on the GaAs substrat...

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Main Authors: Liang Zhao, Xiangdong Ding, Jingjuan Li, Shen Yang, Lei Zhao, Zuoxing Guo
Format: Article
Language:English
Published: AIP Publishing LLC 2017-06-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4985133
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spelling doaj-641cb5ee836e45ab90982b46e83550612020-11-24T23:45:04ZengAIP Publishing LLCAIP Advances2158-32262017-06-0176065003065003-610.1063/1.4985133007706ADVSynthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °CLiang Zhao0Xiangdong Ding1Jingjuan Li2Shen Yang3Lei Zhao4Zuoxing Guo5Key Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaState Key Lab for Mechanical Behavior of Materials, Xi’an Jiaotong University, Xi’an 710049, People’s Republic of ChinaKey Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaKey Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaKey Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaKey Lab of Automobile Materials Ministry of Education, College of Materials Science and Engineering, Jilin University, Changchun 130025, People’s Republic of ChinaWe studied the surface reaction between metallic In and a single-crystal GaAs substrate at 400–600 °C induced by the improved sessile drop method. Studying the surface morphology and microstructure using scanning electron microscopy, we found that many large particles had formed on the GaAs substrate, indicating a violent reaction between the In and GaAs. This reaction became more violent with increasing temperature. Characterizing the generated phases by X-ray diffraction and transmission electron microscopy, we identified the particles as InxGa1−xAs compounds. Our results show that indium (In) reacted with single-crystal GaAs through this method to form InxGa1−xAs compounds. Moreover, during the synthesis of InxGa1−xAs by the sessile drop method, the molten In and GaAs exhibited wettability at 400–600 °C. This experiment lays the foundation for synthesizing InxGa1−xAs compounds only using the metal In and GaAs substrate by a simple method.http://dx.doi.org/10.1063/1.4985133
collection DOAJ
language English
format Article
sources DOAJ
author Liang Zhao
Xiangdong Ding
Jingjuan Li
Shen Yang
Lei Zhao
Zuoxing Guo
spellingShingle Liang Zhao
Xiangdong Ding
Jingjuan Li
Shen Yang
Lei Zhao
Zuoxing Guo
Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C
AIP Advances
author_facet Liang Zhao
Xiangdong Ding
Jingjuan Li
Shen Yang
Lei Zhao
Zuoxing Guo
author_sort Liang Zhao
title Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C
title_short Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C
title_full Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C
title_fullStr Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C
title_full_unstemmed Synthesizing InxGa1−xAs using molten In and GaAs by the sessile drop method at 400–600 °C
title_sort synthesizing inxga1−xas using molten in and gaas by the sessile drop method at 400–600 °c
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2017-06-01
description We studied the surface reaction between metallic In and a single-crystal GaAs substrate at 400–600 °C induced by the improved sessile drop method. Studying the surface morphology and microstructure using scanning electron microscopy, we found that many large particles had formed on the GaAs substrate, indicating a violent reaction between the In and GaAs. This reaction became more violent with increasing temperature. Characterizing the generated phases by X-ray diffraction and transmission electron microscopy, we identified the particles as InxGa1−xAs compounds. Our results show that indium (In) reacted with single-crystal GaAs through this method to form InxGa1−xAs compounds. Moreover, during the synthesis of InxGa1−xAs by the sessile drop method, the molten In and GaAs exhibited wettability at 400–600 °C. This experiment lays the foundation for synthesizing InxGa1−xAs compounds only using the metal In and GaAs substrate by a simple method.
url http://dx.doi.org/10.1063/1.4985133
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