Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films

Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films

We have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7−δ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron...

Full description

Bibliographic Details
Main Authors: Nicolas Gauquelin, Hao Zhang, Guozhen Zhu, John Y. T. Wei, Gianluigi A. Botton
Format: Article
Language:English
Published: AIP Publishing LLC 2018-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5011761
id doaj-6419dbdc78614736b93d10c137197766
record_format Article
spelling doaj-6419dbdc78614736b93d10c1371977662020-11-24T22:35:53ZengAIP Publishing LLCAIP Advances2158-32262018-05-0185055022055022-710.1063/1.5011761080805ADVAtomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin filmsNicolas Gauquelin0Hao Zhang1Guozhen Zhu2John Y. T. Wei3Gianluigi A. Botton4Canadian Centre for Electron Microscopy, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4M1, CanadaDepartment of Physics, University of Toronto, 60 St. George Street, ON M5S1A7, Toronto, CanadaCanadian Centre for Electron Microscopy, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4M1, CanadaDepartment of Physics, University of Toronto, 60 St. George Street, ON M5S1A7, Toronto, CanadaCanadian Centre for Electron Microscopy, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4M1, CanadaWe have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7−δ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO2 planes, resulting in non-stoichiometric layer sequences that could directly impact the high-Tc superconductivity.http://dx.doi.org/10.1063/1.5011761
collection DOAJ
language English
format Article
sources DOAJ
author Nicolas Gauquelin
Hao Zhang
Guozhen Zhu
John Y. T. Wei
Gianluigi A. Botton
spellingShingle Nicolas Gauquelin
Hao Zhang
Guozhen Zhu
John Y. T. Wei
Gianluigi A. Botton
Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films
AIP Advances
author_facet Nicolas Gauquelin
Hao Zhang
Guozhen Zhu
John Y. T. Wei
Gianluigi A. Botton
author_sort Nicolas Gauquelin
title Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films
title_short Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films
title_full Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films
title_fullStr Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films
title_full_unstemmed Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films
title_sort atomic-scale identification of novel planar defect phases in heteroepitaxial yba2cu3o7−δ thin films
publisher AIP Publishing LLC
series AIP Advances
issn 2158-3226
publishDate 2018-05-01
description We have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7−δ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) imaging and electron energy loss spectroscopy (EELS) mapping for unambiguous identification. These planar lattice defects are based on the intergrowth of either a BaO plane between two CuO chains or multiple Y-O layers between two CuO2 planes, resulting in non-stoichiometric layer sequences that could directly impact the high-Tc superconductivity.
url http://dx.doi.org/10.1063/1.5011761
work_keys_str_mv AT nicolasgauquelin atomicscaleidentificationofnovelplanardefectphasesinheteroepitaxialyba2cu3o7dthinfilms
AT haozhang atomicscaleidentificationofnovelplanardefectphasesinheteroepitaxialyba2cu3o7dthinfilms
AT guozhenzhu atomicscaleidentificationofnovelplanardefectphasesinheteroepitaxialyba2cu3o7dthinfilms
AT johnytwei atomicscaleidentificationofnovelplanardefectphasesinheteroepitaxialyba2cu3o7dthinfilms
AT gianluigiabotton atomicscaleidentificationofnovelplanardefectphasesinheteroepitaxialyba2cu3o7dthinfilms
_version_ 1725722418226397184

Similar Items