Enhancement Physical Performance of Nanostructured CuO Films via Surfactant TX-100
<strong></strong>In this study, we informed a systematic approach to obtain CuO films with and without TX-100 surfactant by the SILAR procedure. Morphological, structural and optical features of the CuO films were researched by metallurgical microscope, scanning electron microscopy, X-ra...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Suleyman Demirel University
2018-05-01
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| Series: | Süleyman Demirel Üniversitesi Fen Bilimleri Enstitüsü Dergisi |
| Subjects: | |
| Online Access: | http://dergipark.ulakbim.gov.tr/sdufenbed/article/view/5000215422 |
| Summary: | <strong></strong>In this study, we informed a systematic approach to obtain CuO films with and without TX-100 surfactant by the SILAR procedure. Morphological, structural and optical features of the CuO films were researched by metallurgical microscope, scanning electron microscopy, X-ray diffraction analysis and ultraviolet–visible spectrophotometry respectively with respect to concentrations of TX-100 agent. Metallurgical and scanning electron microscope photographs displayed that the morphology of the film surface was impressed by surfactant TX-100. X-ray diffraction patterns verified that all CuO films have monoclinic crystal lattice structure with preferential orientations of ( 11) and (111) planes. Ultraviolet–visible spectra demonstrated that the optical bandgap and transmittance values of the films were altered with TX-100 content. |
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| ISSN: | 1308-6529 |