Direct structure analysis of advanced nanomaterials by high-resolution electron microscopy
High-resolution electron microscopy (HREM) analysis has contributed to the direct structure analysis of advanced nanostructured materials, of which the properties of these materials are strongly dependent on the atomic arrangements. In the present article, the direct structure analysis of nanostruct...
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| Format: | Article |
| Language: | English |
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De Gruyter
2012-10-01
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| Series: | Nanotechnology Reviews |
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| Online Access: | https://doi.org/10.1515/ntrev-2012-0018 |
| Summary: | High-resolution electron microscopy (HREM) analysis has contributed to the direct structure analysis of advanced nanostructured materials, of which the properties of these materials are strongly dependent on the atomic arrangements. In the present article, the direct structure analysis of nanostructured materials such as boride and oxide materials was described and the high-resolution imaging methods were applied to boron nitride nanomaterials such as nanotubes and nanoparticles. An aberration correction technique is also expected as an advanced nanostructure analysis with higher resolution. The HREM image of TlBa2Ca3Cu4O11 was taken with the incident beam parallel to the a axis together with a structure model after image processing. |
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| ISSN: | 2191-9089 2191-9097 |