Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic Source

We have used a femtosecond time-resolved core-level surface PES system based on the 92-eV harmonic source to study the surface carrier dynamics that induces the transient SPV on semiconductor surfaces. We clarified the temporal evolution of the transient SPV characterized by the time of the photo-ge...

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Main Authors:	Sogawa T., Tateno K., Gotoh H., Nishikawa T., Nakano H., Kato K., Tsunoi T., Oguri K.
Format:	Article
Language:	English
Published:	EDP Sciences 2013-03-01
Series:	EPJ Web of Conferences
Online Access:	http://dx.doi.org/10.1051/epjconf/20134104017

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record_format	Article
spelling	doaj-62f7cc82ab514c69bb76e7b451df65212021-08-02T14:37:09ZengEDP SciencesEPJ Web of Conferences2100-014X2013-03-01410401710.1051/epjconf/20134104017Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic SourceSogawa T.Tateno K.Gotoh H.Nishikawa T.Nakano H.Kato K.Tsunoi T.Oguri K.We have used a femtosecond time-resolved core-level surface PES system based on the 92-eV harmonic source to study the surface carrier dynamics that induces the transient SPV on semiconductor surfaces. We clarified the temporal evolution of the transient SPV characterized by the time of the photo-generated carrier separation and recombination. This result demonstrates the potential of this technique for clarifying the initial stage of the surface carrier dynamics after photoexcitation. http://dx.doi.org/10.1051/epjconf/20134104017
collection	DOAJ
language	English
format	Article
sources	DOAJ
author	Sogawa T. Tateno K. Gotoh H. Nishikawa T. Nakano H. Kato K. Tsunoi T. Oguri K.
spellingShingle	Sogawa T. Tateno K. Gotoh H. Nishikawa T. Nakano H. Kato K. Tsunoi T. Oguri K. Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic Source EPJ Web of Conferences
author_facet	Sogawa T. Tateno K. Gotoh H. Nishikawa T. Nakano H. Kato K. Tsunoi T. Oguri K.
author_sort	Sogawa T.
title	Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic Source
title_short	Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic Source
title_full	Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic Source
title_fullStr	Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic Source
title_full_unstemmed	Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic Source
title_sort	surface carrier dynamics on semiconductor studied with femtosecond core-level photoelectron spectroscopy using extreme ultraviolet high-order harmonic source
publisher	EDP Sciences
series	EPJ Web of Conferences
issn	2100-014X
publishDate	2013-03-01
description	We have used a femtosecond time-resolved core-level surface PES system based on the 92-eV harmonic source to study the surface carrier dynamics that induces the transient SPV on semiconductor surfaces. We clarified the temporal evolution of the transient SPV characterized by the time of the photo-generated carrier separation and recombination. This result demonstrates the potential of this technique for clarifying the initial stage of the surface carrier dynamics after photoexcitation.
url	http://dx.doi.org/10.1051/epjconf/20134104017
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Surface Carrier Dynamics on Semiconductor Studied with Femtosecond Core-Level Photoelectron Spectroscopy Using Extreme Ultraviolet High-Order Harmonic Source

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