Improving the Performance of Charge Trapping Memtransistor as Synaptic Device by Ti-Doped HfO<sub>2</sub>
In this work, we improved the performance of germanium (Ge) channel Charge Trapping MemTransistors (CTMTs) as synaptic device by using Ti-doped HfO<sub>2</sub> as charge trapping layer (CTL). We manipulated the amount of Ti dopant within the HfO<sub>2</sub> CTL to perform the...
Main Authors: | Yu-Che Chou, Wan-Hsuan Chung, Chien-Wei Tsai, Chin-Ya Yi, Chao-Hsin Chien |
---|---|
Format: | Article |
Language: | English |
Published: |
IEEE
2021-01-01
|
Series: | IEEE Journal of the Electron Devices Society |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9296335/ |
Similar Items
-
Impact of the Crystal Phase of ZrO₂ on Charge Trapping Memtransistor as Synaptic Device for Neural Network Application
by: Yu-Che Chou, et al.
Published: (2020-01-01) -
SIMULATION AND DESIGN OF GERMANIUM-BASED MOSFETs FOR CHANNEL LENGTHS OF 100 nm AND BELOW
by: ARNOLD, MARTIN KEITH, JR.
Published: (2007) -
An Investigation of Anode Hole Injection-Induced Abnormal Body Current in n-Channel HfO<sub>2</sub>/TiN MOSFETs
by: Jih-Chien Liao, et al.
Published: (2018-01-01) -
Characterization of High-Performance InGaAs QW-MOSFETs With Reliable Bi-Layer HfO<sub>x</sub>N<sub>y</sub> Gate Stack
by: Su-Keun Eom, et al.
Published: (2019-01-01) -
Radiation Tolerance and Charge Trapping Enhancement of ALD HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> Nanolaminated Dielectrics
by: Dencho Spassov, et al.
Published: (2021-02-01)