Voltage Degradation Model of Thin Film Capacitors
A degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a function of working voltage. On the base of this model, the short term breakdown voltage and its dist...
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| Format: | Article |
| Language: | English |
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Hindawi Limited
1985-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1985/26014 |
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doaj-6251f202c140473196b18d75db41bc182020-11-24T22:40:37ZengHindawi LimitedActive and Passive Electronic Components0882-75161563-50311985-01-01121637010.1155/1985/26014Voltage Degradation Model of Thin Film CapacitorsT. M. Berlicki0Technical University, Wroclaw, PolandA degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a function of working voltage. On the base of this model, the short term breakdown voltage and its distribution is defined. The experimental data presented conforms with the described model.http://dx.doi.org/10.1155/1985/26014 |
| collection |
DOAJ |
| language |
English |
| format |
Article |
| sources |
DOAJ |
| author |
T. M. Berlicki |
| spellingShingle |
T. M. Berlicki Voltage Degradation Model of Thin Film Capacitors Active and Passive Electronic Components |
| author_facet |
T. M. Berlicki |
| author_sort |
T. M. Berlicki |
| title |
Voltage Degradation Model of Thin Film Capacitors |
| title_short |
Voltage Degradation Model of Thin Film Capacitors |
| title_full |
Voltage Degradation Model of Thin Film Capacitors |
| title_fullStr |
Voltage Degradation Model of Thin Film Capacitors |
| title_full_unstemmed |
Voltage Degradation Model of Thin Film Capacitors |
| title_sort |
voltage degradation model of thin film capacitors |
| publisher |
Hindawi Limited |
| series |
Active and Passive Electronic Components |
| issn |
0882-7516 1563-5031 |
| publishDate |
1985-01-01 |
| description |
A degradation model of thin film capacitors is presented. This model takes into consideration that:
(a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a
function of working voltage. On the base of this model, the short term breakdown voltage and its
distribution is defined. The experimental data presented conforms with the described model. |
| url |
http://dx.doi.org/10.1155/1985/26014 |
| work_keys_str_mv |
AT tmberlicki voltagedegradationmodelofthinfilmcapacitors |
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1725704264350695424 |