Voltage Degradation Model of Thin Film Capacitors
A degradation model of thin film capacitors is presented. This model takes into consideration that: (a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a function of working voltage. On the base of this model, the short term breakdown voltage and its dist...
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| Format: | Article |
| Language: | English |
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Hindawi Limited
1985-01-01
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| Series: | Active and Passive Electronic Components |
| Online Access: | http://dx.doi.org/10.1155/1985/26014 |
| Summary: | A degradation model of thin film capacitors is presented. This model takes into consideration that:
(a) the damage rate dD/dt is a function of the damage value D, and (b) the critical damage Dc is a
function of working voltage. On the base of this model, the short term breakdown voltage and its
distribution is defined. The experimental data presented conforms with the described model. |
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| ISSN: | 0882-7516 1563-5031 |