Combination of a Dielectric Continuum Model with Inverse Gas Chromatography for the Characterization of Solid Surfaces

The use of a dielectric continuum model for the characterization of solid surfaces was combined for the first time with inverse gas chromatography. Extension of dielectric continuum models to adsorption from the gaseous phase allowed the distributed surface properties of solid surfaces to be determi...

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Main Authors: C. Mehler, F. Thielmann, W. Peukert
Format: Article
Language:English
Published: Hindawi - SAGE Publishing 2002-11-01
Series:Adsorption Science & Technology
Online Access:https://doi.org/10.1260/02636170260555769
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spelling doaj-6141bd505e8d4409a1215673c53ee1c82021-04-02T11:44:39ZengHindawi - SAGE PublishingAdsorption Science & Technology0263-61742048-40382002-11-012010.1260/02636170260555769Combination of a Dielectric Continuum Model with Inverse Gas Chromatography for the Characterization of Solid SurfacesC. Mehler0F. Thielmann1W. Peukert2 Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik, Technische Universität München, 85748 Garching, Germany Surface Measurement Systems, 3 Warple Mews, Warple Way, London W3 0RF, UK Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik, Technische Universität München, 85748 Garching, GermanyThe use of a dielectric continuum model for the characterization of solid surfaces was combined for the first time with inverse gas chromatography. Extension of dielectric continuum models to adsorption from the gaseous phase allowed the distributed surface properties of solid surfaces to be determined. An inverse gas chromatograph was used for the measurement of adsorption equilibria as a quick alternative to time-consuming measurements by gravimetric or volumetric set-ups. Combination of the two techniques allowed the rapid determination of the distributed properties of solid surfaces to be effected and the results were interpreted in a fundamental physical sense. This led to a novel and promising way for the rapid and exact characterization of solid surfaces.https://doi.org/10.1260/02636170260555769
collection DOAJ
language English
format Article
sources DOAJ
author C. Mehler
F. Thielmann
W. Peukert
spellingShingle C. Mehler
F. Thielmann
W. Peukert
Combination of a Dielectric Continuum Model with Inverse Gas Chromatography for the Characterization of Solid Surfaces
Adsorption Science & Technology
author_facet C. Mehler
F. Thielmann
W. Peukert
author_sort C. Mehler
title Combination of a Dielectric Continuum Model with Inverse Gas Chromatography for the Characterization of Solid Surfaces
title_short Combination of a Dielectric Continuum Model with Inverse Gas Chromatography for the Characterization of Solid Surfaces
title_full Combination of a Dielectric Continuum Model with Inverse Gas Chromatography for the Characterization of Solid Surfaces
title_fullStr Combination of a Dielectric Continuum Model with Inverse Gas Chromatography for the Characterization of Solid Surfaces
title_full_unstemmed Combination of a Dielectric Continuum Model with Inverse Gas Chromatography for the Characterization of Solid Surfaces
title_sort combination of a dielectric continuum model with inverse gas chromatography for the characterization of solid surfaces
publisher Hindawi - SAGE Publishing
series Adsorption Science & Technology
issn 0263-6174
2048-4038
publishDate 2002-11-01
description The use of a dielectric continuum model for the characterization of solid surfaces was combined for the first time with inverse gas chromatography. Extension of dielectric continuum models to adsorption from the gaseous phase allowed the distributed surface properties of solid surfaces to be determined. An inverse gas chromatograph was used for the measurement of adsorption equilibria as a quick alternative to time-consuming measurements by gravimetric or volumetric set-ups. Combination of the two techniques allowed the rapid determination of the distributed properties of solid surfaces to be effected and the results were interpreted in a fundamental physical sense. This led to a novel and promising way for the rapid and exact characterization of solid surfaces.
url https://doi.org/10.1260/02636170260555769
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