Effect of Annealing Temperature on Structural, Morphological, Optical and Electrical Properties of Spray Deposited V2O5 Thin Films

Effect of Annealing Temperature on Structural, Morphological, Optical and Electrical Properties of Spray Deposited V2O5 Thin Films

Nanostructured vanadium pentoxide (V<sub>2</sub>O<sub>5</sub>) thin films have been deposited by a simple and cost-effective spray pyrolysis technique (SPT) at substrate temperature 300 °C and post annealed at atmospheric conditions in the temperature range from 300 °C to 500...

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Bibliographic Details
Main Authors: Vijayakumar YELSANI, Nagaraju POTHUKANURI, Uday Bhasker SONTU, Veeraswamy YARAGANI, Ramana Reddy MUSKU VENKATA
Format: Article
Language:English
Published: Kaunas University of Technology 2019-01-01
Series:Medžiagotyra
Subjects:
V2O5
annealing temperature
Raman spectroscopy
carrier density
Online Access:http://matsc.ktu.lt/index.php/MatSc/article/view/18492

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