Computer simulation of the structural phase transitions in thin ferroelectric films
The influence of free surface and depolarizing field on structural phase transitions in thin ferroelectric films from an ordered state to a disordered one is investigated. The dependences of the order parameter on the distance from the free film surface are calculated. It is shown that with the pres...
Main Authors: | O. G. Maksimova, A. V. Maksimov, O. S. Baruzdina |
---|---|
Format: | Article |
Language: | English |
Published: |
World Scientific Publishing
2017-02-01
|
Series: | Journal of Advanced Dielectrics |
Subjects: | |
Online Access: | http://www.worldscientific.com/doi/pdf/10.1142/S2010135X17500047 |
Similar Items
-
Ferroelectric thin and ultrathin films for MEMS applications
by: Bastani, Yaser
Published: (2015) -
Structural, dielectric and ferroelectric characterization of PZT thin films
by: Araújo E.B., et al.
Published: (1999-01-01) -
Characterisation of ferroelectric PZT thin films for FRAM application
by: Zhu, Hui
Published: (2010) -
Preparation and characterization of ferroelectric yttrium manganite and lead calcium titanate thin films.
Published: (2002) -
Order–disorder phase transitions in thin films described by transverse Ising model
by: Nguyen Tu Niem, et al.
Published: (2016-12-01)