THE ANALYSIS OF DIELECTRICS' SURFACE POTENTIAL MEASURING TECHNIQUE BASED ON A CURRENT FEEDBACK SCHEME

THE ANALYSIS OF DIELECTRICS' SURFACE POTENTIAL MEASURING TECHNIQUE BASED ON A CURRENT FEEDBACK SCHEME

The comparative analysis of time-varying probe methods of measurement of a surface potential is held. Regarding contactless measurement of dielectrics' surface potential in a wide range of meanings, a current feedback scheme is found to be optimal. Advantages of this scheme are high spatial res...

Full description

Bibliographic Details
Main Authors: A. K. Tyavlovsky, A. L. Zharin
Format: Article
Language:English
Published: Belarusian National Technical University 2015-04-01
Series:Pribory i Metody Izmerenij
Subjects:
surface voltage
probe electrometry
dielectric material
compensation scheme
Online Access:https://pimi.bntu.by/jour/article/view/154
Description
Summary:The comparative analysis of time-varying probe methods of measurement of a surface potential is held. Regarding contactless measurement of dielectrics' surface potential in a wide range of meanings, a current feedback scheme is found to be optimal. Advantages of this scheme are high spatial resolution, a wide measuring range and an independence of output signal on a probe-to-surface gap in a certain range of gap meanings. Metrological characteristics of the scheme are analyzed resulting in a mathematical expression for a normalized methodical measurement error.
ISSN:2220-9506
2414-0473

Similar Items