Defect Detection and Localization of Nonlinear System Based on Particle Filter with an Adaptive Parametric Model

A robust particle filter (PF) and its application to fault/defect detection of nonlinear system are investigated in this paper. First, an adaptive parametric model is exploited as the observation model for a nonlinear system. Second, by incorporating the parametric model, particle filter is employed...

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Bibliographic Details
Main Authors: Jingjing Wu, Shujuan Song, Wei An, Deqiang Zhou, Hong Zhang
Format: Article
Language:English
Published: Hindawi Limited 2015-01-01
Series:Mathematical Problems in Engineering
Online Access:http://dx.doi.org/10.1155/2015/759035
Description
Summary:A robust particle filter (PF) and its application to fault/defect detection of nonlinear system are investigated in this paper. First, an adaptive parametric model is exploited as the observation model for a nonlinear system. Second, by incorporating the parametric model, particle filter is employed to estimate more accurate hidden states for the nonlinear stochastic system. Third, by formulating the problem of defect detection within the hypothesis testing framework, the statistical properties of the proposed testing are established. Finally, experimental results demonstrate the effectiveness and robustness of the proposed detector on real defect detection and localization in images.
ISSN:1024-123X
1563-5147