Effect of Etching on the Optical, Morphological Properties of Ag Thin Films for SERS Active Substrates
Structural, optical, and morphological properties of Ag thin films before and after etching were investigated by using X-ray diffraction, UV-Vis spectrophotometer, and field emission scanning electron microscopy (FESEM). The HNO3 roughened Ag thin films exhibit excellent enhancement features and bet...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2013-01-01
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| Series: | Journal of Chemistry |
| Online Access: | http://dx.doi.org/10.1155/2013/285431 |