Mapping of Genetic Loci Conferring Resistance to Leaf Rust From Three Globally Resistant Durum Wheat Sources
Genetic resistance in the host plant is the most economical and environmentally friendly strategy for controlling wheat leaf rust, caused by Puccinia triticina Eriks. The durum wheat lines Gaza (Middle East), Arnacoris (France) and Saragolla (Italy) express high levels of resistance to the Mexican r...
Main Authors: | Dhouha Kthiri, Alexander Loladze, Amidou N’Diaye, Kirby T. Nilsen, Sean Walkowiak, Susanne Dreisigacker, Karim Ammar, Curtis J. Pozniak |
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Format: | Article |
Language: | English |
Published: |
Frontiers Media S.A.
2019-10-01
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Series: | Frontiers in Plant Science |
Subjects: | |
Online Access: | https://www.frontiersin.org/article/10.3389/fpls.2019.01247/full |
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