Mapping of Genetic Loci Conferring Resistance to Leaf Rust From Three Globally Resistant Durum Wheat Sources

Mapping of Genetic Loci Conferring Resistance to Leaf Rust From Three Globally Resistant Durum Wheat Sources

Genetic resistance in the host plant is the most economical and environmentally friendly strategy for controlling wheat leaf rust, caused by Puccinia triticina Eriks. The durum wheat lines Gaza (Middle East), Arnacoris (France) and Saragolla (Italy) express high levels of resistance to the Mexican r...

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Bibliographic Details
Main Authors: Dhouha Kthiri, Alexander Loladze, Amidou N’Diaye, Kirby T. Nilsen, Sean Walkowiak, Susanne Dreisigacker, Karim Ammar, Curtis J. Pozniak
Format: Article
Language:English
Published: Frontiers Media S.A. 2019-10-01
Series:Frontiers in Plant Science
Subjects:
durum wheat
leaf rust
Puccinia triticina
resistance
quantitative trait loci
single nucleotide polymorphism (SNP)
Online Access:https://www.frontiersin.org/article/10.3389/fpls.2019.01247/full

Internet

https://www.frontiersin.org/article/10.3389/fpls.2019.01247/full

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