Influence of Substrate Material on Radiation Characteristics of THz Photoconductive Emitters

We present in this paper spectral and spatial characteristics of terahertz emission from standard dipole antenna structures used as emitters depending on the substrate material. All antenna structures were lithographically fabricated on low-temperature (LT) grown, few-micrometers-thick gallium arsen...

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Main Authors: Jens Klier, Garik Torosyan, Nina Susan Schreiner, Daniel Molter, Frank Ellrich, Wissem Zouaghi, Emilien Peytavit, Jean-François Lampin, René Beigang, Joachim Jonuscheit, Georg von Freymann
Format: Article
Language:English
Published: Hindawi Limited 2015-01-01
Series:International Journal of Antennas and Propagation
Online Access:http://dx.doi.org/10.1155/2015/540175
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spelling doaj-5b3d3f64991549938cd6d661cd620db02020-11-24T23:41:33ZengHindawi LimitedInternational Journal of Antennas and Propagation1687-58691687-58772015-01-01201510.1155/2015/540175540175Influence of Substrate Material on Radiation Characteristics of THz Photoconductive EmittersJens Klier0Garik Torosyan1Nina Susan Schreiner2Daniel Molter3Frank Ellrich4Wissem Zouaghi5Emilien Peytavit6Jean-François Lampin7René Beigang8Joachim Jonuscheit9Georg von Freymann10Fraunhofer Institute for Physical Measurement Techniques IPM, Fraunhofer-Platz 1, 67663 Kaiserslautern, GermanyFraunhofer Institute for Physical Measurement Techniques IPM, Fraunhofer-Platz 1, 67663 Kaiserslautern, GermanyFraunhofer Institute for Physical Measurement Techniques IPM, Fraunhofer-Platz 1, 67663 Kaiserslautern, GermanyFraunhofer Institute for Physical Measurement Techniques IPM, Fraunhofer-Platz 1, 67663 Kaiserslautern, GermanyFraunhofer Institute for Physical Measurement Techniques IPM, Fraunhofer-Platz 1, 67663 Kaiserslautern, GermanyPhysikalisches Institut, Goethe Universität, 60438 Frankfurt am Main, GermanyInstitut d’Electronique, Microélectronique et de Nanotechnologie (IEMN), Villeneuve-d’Ascq Cedex, 59652 Lille, FranceInstitut d’Electronique, Microélectronique et de Nanotechnologie (IEMN), Villeneuve-d’Ascq Cedex, 59652 Lille, FranceDepartment of Physics and Research Center OPTIMAS, University of Kaiserslautern, 67663 Kaiserslautern, GermanyFraunhofer Institute for Physical Measurement Techniques IPM, Fraunhofer-Platz 1, 67663 Kaiserslautern, GermanyFraunhofer Institute for Physical Measurement Techniques IPM, Fraunhofer-Platz 1, 67663 Kaiserslautern, GermanyWe present in this paper spectral and spatial characteristics of terahertz emission from standard dipole antenna structures used as emitters depending on the substrate material. All antenna structures were lithographically fabricated on low-temperature (LT) grown, few-micrometers-thick gallium arsenide (GaAs) layers. To investigate the effect of the substrate material on the radiation pattern of terahertz beams, either semi-insulating gallium arsenide or high-resistivity silicon substrate wafers have been used. As detector a standard 40 µm long dipole antenna on a semi-insulating GaAs substrate with a low-temperature grown gallium arsenide layer on it has been employed; this configuration allows for broadband detection and is still efficient enough for the characterization purpose. Strong dependence of the radiation pattern on the substrate used for the terahertz source is demonstrated. The measured patterns and differences between the two cases of substrates are well explained by means of classical diffraction.http://dx.doi.org/10.1155/2015/540175
collection DOAJ
language English
format Article
sources DOAJ
author Jens Klier
Garik Torosyan
Nina Susan Schreiner
Daniel Molter
Frank Ellrich
Wissem Zouaghi
Emilien Peytavit
Jean-François Lampin
René Beigang
Joachim Jonuscheit
Georg von Freymann
spellingShingle Jens Klier
Garik Torosyan
Nina Susan Schreiner
Daniel Molter
Frank Ellrich
Wissem Zouaghi
Emilien Peytavit
Jean-François Lampin
René Beigang
Joachim Jonuscheit
Georg von Freymann
Influence of Substrate Material on Radiation Characteristics of THz Photoconductive Emitters
International Journal of Antennas and Propagation
author_facet Jens Klier
Garik Torosyan
Nina Susan Schreiner
Daniel Molter
Frank Ellrich
Wissem Zouaghi
Emilien Peytavit
Jean-François Lampin
René Beigang
Joachim Jonuscheit
Georg von Freymann
author_sort Jens Klier
title Influence of Substrate Material on Radiation Characteristics of THz Photoconductive Emitters
title_short Influence of Substrate Material on Radiation Characteristics of THz Photoconductive Emitters
title_full Influence of Substrate Material on Radiation Characteristics of THz Photoconductive Emitters
title_fullStr Influence of Substrate Material on Radiation Characteristics of THz Photoconductive Emitters
title_full_unstemmed Influence of Substrate Material on Radiation Characteristics of THz Photoconductive Emitters
title_sort influence of substrate material on radiation characteristics of thz photoconductive emitters
publisher Hindawi Limited
series International Journal of Antennas and Propagation
issn 1687-5869
1687-5877
publishDate 2015-01-01
description We present in this paper spectral and spatial characteristics of terahertz emission from standard dipole antenna structures used as emitters depending on the substrate material. All antenna structures were lithographically fabricated on low-temperature (LT) grown, few-micrometers-thick gallium arsenide (GaAs) layers. To investigate the effect of the substrate material on the radiation pattern of terahertz beams, either semi-insulating gallium arsenide or high-resistivity silicon substrate wafers have been used. As detector a standard 40 µm long dipole antenna on a semi-insulating GaAs substrate with a low-temperature grown gallium arsenide layer on it has been employed; this configuration allows for broadband detection and is still efficient enough for the characterization purpose. Strong dependence of the radiation pattern on the substrate used for the terahertz source is demonstrated. The measured patterns and differences between the two cases of substrates are well explained by means of classical diffraction.
url http://dx.doi.org/10.1155/2015/540175
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