High-quality binary fringe patterns generation by combining optimization on global and local similarity

• Main Authors: Feng Lu, Chengdong Wu, Jikun Yang
• Format: Article
• Language: English
• Published: SpringerOpen 2018-04-01
• Series: Journal of the European Optical Society-Rapid Publications
• Subjects: 3D measurement profilometry; Bianry defocusing; Dithering; Optimization
• Online Access: http://link.springer.com/article/10.1186/s41476-018-0081-0

Abstract Background The recently proposed optimized dithering techniques can improve measurement quality. However, the objective function in these optimization methods just qualifies the global similarity of the pattern while the global optimization methods ignore the influences of local structure. Method In order to get high quality binary dithered patterns, this paper presents an algorithm which combines optimization on global and local similarity and implements it in the whole-fringe optimization. Results Both the simulation and experimental results demonstrate that the proposed algorithm can achieve binary fringe patterns with higher phase quality and less intensity difference. The fringe patterns based on the proposed method can get high quality measurement results. Conclusion The proposed method can get high quality binary dithered patterns under different defocusing levels by combining global similarity and local structure similarity. The proposed method can improve the robustness to the amounts of defocusing.