Satellite Solar-Induced Chlorophyll Fluorescence Reveals Heat Stress Impacts on Wheat Yield in India

• Main Authors: Yang Song, Jing Wang, Lixin Wang
• Format: Article
• Language: English
• Published: MDPI AG 2020-10-01
• Series: Remote Sensing
• Subjects: global warming; remote sensing; multivariable linear regression; accumulated degree days; yield loss
• Online Access: https://www.mdpi.com/2072-4292/12/20/3277

With continued global warming, the frequency and severity of heat wave events increased over the past decades, threatening both regional and global food security in the future. There are growing interests to study the impacts of drought on crop. However, studies on the impacts of heat stress on crop photosynthesis and yield are still lacking. To fill this knowledge gap, we used both statistical models and satellite solar-induced chlorophyll fluorescence (SIF) data to assess the impacts of heat stress on wheat yield in a major wheat growing region, the Indo-Gangetic Plains (IGP), India. The statistical model showed that the relationships between different accumulated degree days (ADD) and reported wheat yield were significantly negative. The results confirmed that heat stress affected wheat yield across this region. Building on such information, satellite SIF observations were used to further explore the physiological basis of heat stress impacts on wheat yield. Our results showed that SIF had strong negative correlations with ADDs and was capable of monitoring heat stress. The SIF results also indicated that heat stress caused yield loss by directly impacting the photosynthetic capacity in wheat. Overall, our findings demonstrated that SIF as an effective proxy for photosynthetic activity would improve our understanding of the impacts of heat stress on wheat yield.