Self-Selecting Resistive Switching Scheme Using TiO2 Nanorod Arrays
Abstract In this study, the resistive switching scheme using TiO2 nanorod arrays synthesized by a large-scale and low-cost hydrothermal process was reported. Especially, the nonlinear I–V characteristics of TiO2 nanorod arrays with a nonlinearity of up to ~10, which suppress the leakage current less...
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2017-05-01
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Online Access: | https://doi.org/10.1038/s41598-017-01354-7 |
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doaj-5a63eb92e4424ca7bacb68b435efd1fd2020-12-08T01:23:40ZengNature Publishing GroupScientific Reports2045-23222017-05-01711910.1038/s41598-017-01354-7Self-Selecting Resistive Switching Scheme Using TiO2 Nanorod ArraysChi-Hsin Huang0Ta-Shun Chou1Jian-Shiou Huang2Shih-Ming Lin3Yu-Lun Chueh4Department of Materials Science & Engineering, National Tsing-Hua UniversityDepartment of Materials Science & Engineering, National Tsing-Hua UniversityDepartment of Materials Science & Engineering, National Tsing-Hua UniversityDepartment of Materials Science & Engineering, National Tsing-Hua UniversityDepartment of Materials Science & Engineering, National Tsing-Hua UniversityAbstract In this study, the resistive switching scheme using TiO2 nanorod arrays synthesized by a large-scale and low-cost hydrothermal process was reported. Especially, the nonlinear I–V characteristics of TiO2 nanorod arrays with a nonlinearity of up to ~10, which suppress the leakage current less than 10−4 Acm−2, were demonstrated, exhibiting a self-selecting resistive switching behavior. It provides a simple pathway for integration of RRAM crossbar arrays without additional stacking of active devices. The mechanisms of the nonlinear resistive switching behaviors were discussed in detail. In addition, the maximum array numbers of 79 for self-selecting RRAM cells were estimated. The results demonstrate an opportunity of using the concept of self-selecting resistive switching characteristics in a single material, which offers a new strategy to tackle the sneak path issue of RRAM in the crossbar arrays structure.https://doi.org/10.1038/s41598-017-01354-7 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Chi-Hsin Huang Ta-Shun Chou Jian-Shiou Huang Shih-Ming Lin Yu-Lun Chueh |
spellingShingle |
Chi-Hsin Huang Ta-Shun Chou Jian-Shiou Huang Shih-Ming Lin Yu-Lun Chueh Self-Selecting Resistive Switching Scheme Using TiO2 Nanorod Arrays Scientific Reports |
author_facet |
Chi-Hsin Huang Ta-Shun Chou Jian-Shiou Huang Shih-Ming Lin Yu-Lun Chueh |
author_sort |
Chi-Hsin Huang |
title |
Self-Selecting Resistive Switching Scheme Using TiO2 Nanorod Arrays |
title_short |
Self-Selecting Resistive Switching Scheme Using TiO2 Nanorod Arrays |
title_full |
Self-Selecting Resistive Switching Scheme Using TiO2 Nanorod Arrays |
title_fullStr |
Self-Selecting Resistive Switching Scheme Using TiO2 Nanorod Arrays |
title_full_unstemmed |
Self-Selecting Resistive Switching Scheme Using TiO2 Nanorod Arrays |
title_sort |
self-selecting resistive switching scheme using tio2 nanorod arrays |
publisher |
Nature Publishing Group |
series |
Scientific Reports |
issn |
2045-2322 |
publishDate |
2017-05-01 |
description |
Abstract In this study, the resistive switching scheme using TiO2 nanorod arrays synthesized by a large-scale and low-cost hydrothermal process was reported. Especially, the nonlinear I–V characteristics of TiO2 nanorod arrays with a nonlinearity of up to ~10, which suppress the leakage current less than 10−4 Acm−2, were demonstrated, exhibiting a self-selecting resistive switching behavior. It provides a simple pathway for integration of RRAM crossbar arrays without additional stacking of active devices. The mechanisms of the nonlinear resistive switching behaviors were discussed in detail. In addition, the maximum array numbers of 79 for self-selecting RRAM cells were estimated. The results demonstrate an opportunity of using the concept of self-selecting resistive switching characteristics in a single material, which offers a new strategy to tackle the sneak path issue of RRAM in the crossbar arrays structure. |
url |
https://doi.org/10.1038/s41598-017-01354-7 |
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