Photoemission Spectroscopy Characterization of Attempts to Deposit MoO2 Thin Film
Attempts to deposit molybdenum dioxide (MoO2) thin films have been described. Electronic structure of films, deposited by thermal evaporation of MoO2 powder, had been investigated with ultraviolet photoemission and X-ray photoemission spectroscopy (UPS and XPS). The thermally evaporated films were f...
Main Authors: | Irfan, Franky So, Yongli Gao |
---|---|
Format: | Article |
Language: | English |
Published: |
Hindawi Limited
2011-01-01
|
Series: | International Journal of Photoenergy |
Online Access: | http://dx.doi.org/10.1155/2011/314702 |
Similar Items
-
Tunability of MoO3 Thin-Film Properties Due to Annealing in Situ Monitored by Hard X‑ray Photoemission
by: Xiaxia Liao, et al.
Published: (2019-06-01) -
Characterization of L-cysteine thin films via photoemission spectroscopy
by: Gargagliano, Roy
Published: (2005) -
ZnO/MoO3 Superlattice Thin Films : Growth by Atomic Layer Deposition and Characterizations of Physical Properties
by: Yu-Syuan Hong, et al.
Published: (2017) -
Photocatalytic Study of ZnO/MoO3 Thin Film
by: CHEN, JENG-LUNG, et al.
Published: (2018) -
Structural Evolution of MoO<sub>3</sub> Thin Films Deposited on Copper Substrates upon Annealing: An X-ray Absorption Spectroscopy Study
by: Salvatore Macis, et al.
Published: (2019-04-01)