Crystal interface and high-resolution electron microscopy—the best partner
Several contributions of HRTEM on the interface science are reviewed in chronological order. The first contribution of HRTEM is the observation of gold (113)Σ°11 boundary, giving experimental proof of the CSL model. An observation of the asymmetric (112)Σ°3 boundary follows. A SiC grain boundary is...
Main Author: | H Ichinose |
---|---|
Format: | Article |
Language: | English |
Published: |
Taylor & Francis Group
2000-01-01
|
Series: | Science and Technology of Advanced Materials |
Online Access: | http://www.iop.org/EJ/abstract/-search=58672466.26/1468-6996/1/1/A02 |
Similar Items
-
High resolution electron microscopy of thin protein crystals
by: Bullough, Per Andrew
Published: (1988) -
High resolution electron microscopy of lattice defects in crystals
by: Ray, I. L. F.
Published: (1971) -
In-Situ High Resolution Electron Microscopy Observation of the Interphase Interfaces
by: Sasaki, Katsuhiro, et al.
Published: (1989) -
High Resolution Electron Microscopy of Pd/MgO interface
by: Hung, Jyh Sheng, et al.
Published: (1993) -
High Resolution Electron Microscopy of Cu/MgO Interfaces
by: Chiou, Shi Kae, et al.
Published: (1993)