A study of dopant incorporation in Te-doped GaAsSb nanowires using a combination of XPS/UPS, and C-AFM/SKPM

A study of dopant incorporation in Te-doped GaAsSb nanowires using a combination of XPS/UPS, and C-AFM/SKPM

Abstract We report the first study on doping assessment in Te-doped GaAsSb nanowires (NWs) with variation in Gallium Telluride (GaTe) cell temperature, using X-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), conductive-atomic force microscopy (C-AFM), and scanning...

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Bibliographic Details
Main Authors: Priyanka Ramaswamy, Shisir Devkota, Rabin Pokharel, Surya Nalamati, Fred Stevie, Keith Jones, Lew Reynolds, Shanthi Iyer
Format: Article
Language:English
Published: Nature Publishing Group 2021-04-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-021-87825-4

Internet

https://doi.org/10.1038/s41598-021-87825-4

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