Validation of the SNTHERM Model Applied for Snow Depth, Grain Size, and Brightness Temperature Simulation at Meteorological Stations in China

Validation of the SNTHERM Model Applied for Snow Depth, Grain Size, and Brightness Temperature Simulation at Meteorological Stations in China

Validation of the snow process model is an important preliminary work for the snow parameter estimation. The snow grain growth is a continuous and accumulative process, which cannot be evaluated without comparing with the observations in snow season scale. In order to understand the snow properties...

Full description

Bibliographic Details
Main Authors: Tao Chen, Jinmei Pan, Shunli Chang, Chuan Xiong, Jiancheng Shi, Mingyu Liu, Tao Che, Lifu Wang, Hongrui Liu
Format: Article
Language:English
Published: MDPI AG 2020-02-01
Series:Remote Sensing
Subjects:
snow
snow process model validation
snow depth
snow grain size
passive microwave
sntherm
memls
Online Access:https://www.mdpi.com/2072-4292/12/3/507

Similar Items

Similar Items