A Systematic Compact Model Parameter Calibration with Adaptive Pattern Search Algorithm

A Systematic Compact Model Parameter Calibration with Adaptive Pattern Search Algorithm

A systematic device-model calibration (extraction) methodology has been proposed to reduce parameter calibration time of advanced compact model for modern nano-scale semiconductor devices. The adaptive pattern search algorithm is a variant of the direct search method, which explore in the parameter...

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Bibliographic Details
Main Authors: Jeesoo Chang, Sungmin Hwang, Kyungchul Park, Taejin Jang, Kyung-Kyu Min, Min-Hye Oh, Jonghyuk Park, Jong-Ho Lee, Byung-Gook Park
Format: Article
Language:English
Published: MDPI AG 2021-05-01
Series:Applied Sciences
Subjects:
compact model
parameter calibration
parameter extraction
pattern search
Hooke-Jeeves method
optimization algorithm
Online Access:https://www.mdpi.com/2076-3417/11/9/4155

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