Radiation Damage in Electronic Memory Devices

Radiation Damage in Electronic Memory Devices

This paper investigates the behavior of semiconductor memories exposed to radiation in order to establish their applicability in a radiation environment. The experimental procedure has been used to test radiation hardness of commercial semiconductor memories. Different types of memory chips have bee...

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Bibliographic Details
Main Authors:	Irfan Fetahović, Milić Pejović, Miloš Vujisić
Format:	Article
Language:	English
Published:	Hindawi Limited 2013-01-01
Series:	International Journal of Photoenergy
Online Access:	http://dx.doi.org/10.1155/2013/170269

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