Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker

Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to chop the beam that originates from a high brightness Schottky source may provide an attractive alternative to direct pulsed laser illumination of the sou...

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Bibliographic Details
Main Authors: I. G. C. Weppelman, R. J. Moerland, L. Zhang, E. Kieft, P. Kruit, J. P. Hoogenboom
Format: Article
Language:English
Published: AIP Publishing LLC and ACA 2019-03-01
Series:Structural Dynamics
Online Access:http://dx.doi.org/10.1063/1.5089517

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