Relating optical and microwave grain metrics of snow: the relevance of grain shape
Grain shape is commonly understood as a morphological characteristic of snow that is independent of the optical diameter (or specific surface area) influencing its physical properties. In this study we use tomography images to investigate two objectively defined metrics of grain shape that naturally...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Copernicus Publications
2016-11-01
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Series: | The Cryosphere |
Online Access: | http://www.the-cryosphere.net/10/2847/2016/tc-10-2847-2016.pdf |
Summary: | Grain shape is commonly understood as a morphological characteristic of snow that is independent
of the optical diameter (or specific surface area) influencing its physical properties. In this study we use tomography
images to investigate two objectively defined metrics of grain shape
that naturally extend the characterization of snow in terms of the
optical diameter. One is the curvature length <i>λ</i><sub>2</sub>, related to the third-order term in the expansion of the two-point correlation function, and
the other is the second moment <i>μ</i><sub>2</sub> of the chord length
distributions. We show that the exponential correlation length, widely
used for microwave modeling, can be related to the optical diameter
and <i>λ</i><sub>2</sub>. Likewise, we show that the absorption enhancement parameter <i>B</i>
and the asymmetry factor <i>g</i><sup>G</sup>, required for optical modeling, can be
related to the optical diameter and <i>μ</i><sub>2</sub>. We establish various
statistical relations between all size metrics obtained from the
two-point correlation function and the chord length
distribution. Overall our results suggest that the characterization of
grain shape via <i>λ</i><sub>2</sub> or <i>μ</i><sub>2</sub> is virtually equivalent since both capture
similar aspects of size dispersity. Our results provide a common
ground for the different grain metrics required for optical and
microwave modeling of snow. |
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ISSN: | 1994-0416 1994-0424 |