Temperature mapping of operating nanoscale devices by scanning probe thermometry
Thermometry using scanning probe techniques allows for the thermal imaging and characterization of devices with nanoscale resolution, however can be hindered by contact-related artefacts. Here, the authors demonstrate a thermal scanning probe approach which eliminates contact-resistance effects.
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2016-03-01
|
| Series: | Nature Communications |
| Online Access: | https://doi.org/10.1038/ncomms10874 |