Effects of vacuum annealing on the electron mobility of epitaxial La-doped BaSnO3 films

Wide bandgap (Eg ∼ 3.1 eV) La-doped BaSnO3 (LBSO) has attracted increasing attention as one of the transparent oxide semiconductors since its bulk single crystal shows a high carrier mobility (∼320 cm2 V−1 s−1) with a high carrier concentration (∼1020 cm−3). For this reason, many researchers have fa...

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Main Authors: Hai Jun Cho, Takaki Onozato, Mian Wei, Anup Sanchela, Hiromichi Ohta
Format: Article
Language:English
Published: AIP Publishing LLC 2019-02-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.5054154
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spelling doaj-51340388ac984cb98f30a5facfdbcbdc2020-11-24T21:51:13ZengAIP Publishing LLCAPL Materials2166-532X2019-02-0172022507022507-710.1063/1.5054154014992APMEffects of vacuum annealing on the electron mobility of epitaxial La-doped BaSnO3 filmsHai Jun Cho0Takaki Onozato1Mian Wei2Anup Sanchela3Hiromichi Ohta4Research Institute for Electronic Science, Hokkaido University, N20W10, Kita, Sapporo 001-0020, JapanGraduate School of Information Science and Technology, Hokkaido University, N14W9, Kita, Sapporo 060-0814, JapanGraduate School of Information Science and Technology, Hokkaido University, N14W9, Kita, Sapporo 060-0814, JapanResearch Institute for Electronic Science, Hokkaido University, N20W10, Kita, Sapporo 001-0020, JapanResearch Institute for Electronic Science, Hokkaido University, N20W10, Kita, Sapporo 001-0020, JapanWide bandgap (Eg ∼ 3.1 eV) La-doped BaSnO3 (LBSO) has attracted increasing attention as one of the transparent oxide semiconductors since its bulk single crystal shows a high carrier mobility (∼320 cm2 V−1 s−1) with a high carrier concentration (∼1020 cm−3). For this reason, many researchers have fabricated LBSO epitaxial films thus far, but the obtainable carrier mobility is substantially low compared to that of single crystals due to the formation of the lattice/structural defects. Here we report that the mobility suppression in LBSO films can be lifted by a simple vacuum annealing process. The oxygen vacancies generated from vacuum annealing reduced the thermal stability of LBSO films on MgO substrates, which increased their carrier concentrations and lateral grain sizes at elevated temperatures. As a result, the carrier mobilities were greatly improved, which does not occur after heat treatment in air. We report a factorial design experiment for the vacuum annealing of LBSO films on MgO substrates and discuss the implications of the results. Our findings expand our current knowledge on the point defect formation in epitaxial LBSO films and show that vacuum annealing is a powerful tool for enhancing the mobility values of LBSO films.http://dx.doi.org/10.1063/1.5054154
collection DOAJ
language English
format Article
sources DOAJ
author Hai Jun Cho
Takaki Onozato
Mian Wei
Anup Sanchela
Hiromichi Ohta
spellingShingle Hai Jun Cho
Takaki Onozato
Mian Wei
Anup Sanchela
Hiromichi Ohta
Effects of vacuum annealing on the electron mobility of epitaxial La-doped BaSnO3 films
APL Materials
author_facet Hai Jun Cho
Takaki Onozato
Mian Wei
Anup Sanchela
Hiromichi Ohta
author_sort Hai Jun Cho
title Effects of vacuum annealing on the electron mobility of epitaxial La-doped BaSnO3 films
title_short Effects of vacuum annealing on the electron mobility of epitaxial La-doped BaSnO3 films
title_full Effects of vacuum annealing on the electron mobility of epitaxial La-doped BaSnO3 films
title_fullStr Effects of vacuum annealing on the electron mobility of epitaxial La-doped BaSnO3 films
title_full_unstemmed Effects of vacuum annealing on the electron mobility of epitaxial La-doped BaSnO3 films
title_sort effects of vacuum annealing on the electron mobility of epitaxial la-doped basno3 films
publisher AIP Publishing LLC
series APL Materials
issn 2166-532X
publishDate 2019-02-01
description Wide bandgap (Eg ∼ 3.1 eV) La-doped BaSnO3 (LBSO) has attracted increasing attention as one of the transparent oxide semiconductors since its bulk single crystal shows a high carrier mobility (∼320 cm2 V−1 s−1) with a high carrier concentration (∼1020 cm−3). For this reason, many researchers have fabricated LBSO epitaxial films thus far, but the obtainable carrier mobility is substantially low compared to that of single crystals due to the formation of the lattice/structural defects. Here we report that the mobility suppression in LBSO films can be lifted by a simple vacuum annealing process. The oxygen vacancies generated from vacuum annealing reduced the thermal stability of LBSO films on MgO substrates, which increased their carrier concentrations and lateral grain sizes at elevated temperatures. As a result, the carrier mobilities were greatly improved, which does not occur after heat treatment in air. We report a factorial design experiment for the vacuum annealing of LBSO films on MgO substrates and discuss the implications of the results. Our findings expand our current knowledge on the point defect formation in epitaxial LBSO films and show that vacuum annealing is a powerful tool for enhancing the mobility values of LBSO films.
url http://dx.doi.org/10.1063/1.5054154
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