Non-thermal particle effects on the Hα and Hβ line profiles in the 18 August 2002 solar flare
We present results of the 18 August 2002 flare analysis as an example for developing a diagnostic tool for thermal and non-thermal processes in chromospheric lines. Taking into account the hard X-ray (HXR) emission, we attempted to derive the Hα and Hβ line properties which were caused by the no...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
Copernicus Publications
2008-10-01
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Series: | Annales Geophysicae |
Online Access: | https://www.ann-geophys.net/26/2975/2008/angeo-26-2975-2008.pdf |
Summary: | We present results of the 18 August 2002 flare analysis as an
example for developing a diagnostic tool for thermal and non-thermal
processes in chromospheric lines. Taking into account the hard X-ray
(HXR) emission, we attempted to derive the Hα and Hβ line
properties which were caused by the non-thermal electron contribution
and could be useful for diagnostic purposes. The flare itself was a
sequence of harder and softer bursts in HXR and we investigated three
flare kernels associated with them. Two of the kernels appeared
simultaneously. This phase of the flare could be observed in a broad
band of wavelengths (HXR, UV, optical and microwaves). Kernel 1 did
not clearly coincide with any HXR source but its intensity increased
with the HXR flux rise. The flare kernel~3 did not show any significant
response in microwaves, however, the related HXR flux was comparable
with the flux of the previous kernels. We carried out an analysis of the
difference between the Hα/Hβ profile rate in the line
center at the distance of 0.5 Å from the line center. Only
kernel 2 showed parameter fluctuations that were related to HXR
flux evolution. The supposition of the non-thermal electron effect on the
Hα/Hβ profile ratio was confirmed only at the kernel
connected with the 25–50 keV HXR source. We found further
confirmation that the Hα/Hβ line intensity ratio could be
used as a diagnostic tool for non-thermal electron presence. |
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ISSN: | 0992-7689 1432-0576 |