Modeling of Label-Free Optical Waveguide Biosensors with Surfaces Covered Partially by Vertically Homogeneous and Inhomogeneous Films

Optical Waveguide Lightmode Spectroscopy (OWLS) is widely applied to monitor protein adsorption, polymer self-assembly, and living cells on the surface of the sensor in a label-free manner. Typically, to determine the optogeometrical parameters of the analyte layer (adlayer), the homogeneous and iso...

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Main Authors: Balint Kovacs, Robert Horvath
Format: Article
Language:English
Published: Hindawi Limited 2019-01-01
Series:Journal of Sensors
Online Access:http://dx.doi.org/10.1155/2019/1762450
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spelling doaj-4c027aaceeeb44ee9e5e37a1f3581f752020-11-25T02:46:16ZengHindawi LimitedJournal of Sensors1687-725X1687-72682019-01-01201910.1155/2019/17624501762450Modeling of Label-Free Optical Waveguide Biosensors with Surfaces Covered Partially by Vertically Homogeneous and Inhomogeneous FilmsBalint Kovacs0Robert Horvath1Nanobiosensorics Laboratory, MTA EK MFA, Budapest, HungaryNanobiosensorics Laboratory, MTA EK MFA, Budapest, HungaryOptical Waveguide Lightmode Spectroscopy (OWLS) is widely applied to monitor protein adsorption, polymer self-assembly, and living cells on the surface of the sensor in a label-free manner. Typically, to determine the optogeometrical parameters of the analyte layer (adlayer), the homogeneous and isotropic thin adlayer model is used to analyze the recorded OWLS data. However, in most practical situations, the analyte layer is neither homogeneous nor isotropic. Therefore, the measurement with two waveguide modes and the applied model cannot supply enough information about the parameters of the possible adlayer inhomogeneity and anisotropy. Only the so-called quasihomogeneous adlayer refractive index, layer thickness, and surface mass can be determined. In the present work, we construct an inhomogeneous adlayer model. In our model, the adlayer covers the waveguide surface only partially and it has a given refractive index profile perpendicular to the surface of the sensor. Using analytical and numerical model calculations, the step-index and exponential refractive index profiles are investigated with varying surface coverages from 0 to 100%. The relevant equations are summarized and three typically employed waveguide sensor structures are studied in detail. We predict the errors in the calculated optogeometrical parameters of the adlayer by simulating the OWLS measurement on an assumed inhomogeneous adlayer. We found that the surface coverage has negligible influence on the calculated refractive index below film thicknesses of 5 nm; the calculated refractive index is close to the refractive index of the adlayer islands. But the determined quasihomogeneous adlayer refractive index and surface mass are always underrated; the calculated quasihomogeneous thickness is heavily influenced by the surface coverage. Depending on the refractive index profile, waveguide geometry, and surface coverage, the thickness obtained from the homogeneous and isotropic modeling can even take negative and largely overestimated values, too. Therefore, experimentally obtained unrealistic adlayer values, which were dismissed previously, might be important indicators of layer structure.http://dx.doi.org/10.1155/2019/1762450
collection DOAJ
language English
format Article
sources DOAJ
author Balint Kovacs
Robert Horvath
spellingShingle Balint Kovacs
Robert Horvath
Modeling of Label-Free Optical Waveguide Biosensors with Surfaces Covered Partially by Vertically Homogeneous and Inhomogeneous Films
Journal of Sensors
author_facet Balint Kovacs
Robert Horvath
author_sort Balint Kovacs
title Modeling of Label-Free Optical Waveguide Biosensors with Surfaces Covered Partially by Vertically Homogeneous and Inhomogeneous Films
title_short Modeling of Label-Free Optical Waveguide Biosensors with Surfaces Covered Partially by Vertically Homogeneous and Inhomogeneous Films
title_full Modeling of Label-Free Optical Waveguide Biosensors with Surfaces Covered Partially by Vertically Homogeneous and Inhomogeneous Films
title_fullStr Modeling of Label-Free Optical Waveguide Biosensors with Surfaces Covered Partially by Vertically Homogeneous and Inhomogeneous Films
title_full_unstemmed Modeling of Label-Free Optical Waveguide Biosensors with Surfaces Covered Partially by Vertically Homogeneous and Inhomogeneous Films
title_sort modeling of label-free optical waveguide biosensors with surfaces covered partially by vertically homogeneous and inhomogeneous films
publisher Hindawi Limited
series Journal of Sensors
issn 1687-725X
1687-7268
publishDate 2019-01-01
description Optical Waveguide Lightmode Spectroscopy (OWLS) is widely applied to monitor protein adsorption, polymer self-assembly, and living cells on the surface of the sensor in a label-free manner. Typically, to determine the optogeometrical parameters of the analyte layer (adlayer), the homogeneous and isotropic thin adlayer model is used to analyze the recorded OWLS data. However, in most practical situations, the analyte layer is neither homogeneous nor isotropic. Therefore, the measurement with two waveguide modes and the applied model cannot supply enough information about the parameters of the possible adlayer inhomogeneity and anisotropy. Only the so-called quasihomogeneous adlayer refractive index, layer thickness, and surface mass can be determined. In the present work, we construct an inhomogeneous adlayer model. In our model, the adlayer covers the waveguide surface only partially and it has a given refractive index profile perpendicular to the surface of the sensor. Using analytical and numerical model calculations, the step-index and exponential refractive index profiles are investigated with varying surface coverages from 0 to 100%. The relevant equations are summarized and three typically employed waveguide sensor structures are studied in detail. We predict the errors in the calculated optogeometrical parameters of the adlayer by simulating the OWLS measurement on an assumed inhomogeneous adlayer. We found that the surface coverage has negligible influence on the calculated refractive index below film thicknesses of 5 nm; the calculated refractive index is close to the refractive index of the adlayer islands. But the determined quasihomogeneous adlayer refractive index and surface mass are always underrated; the calculated quasihomogeneous thickness is heavily influenced by the surface coverage. Depending on the refractive index profile, waveguide geometry, and surface coverage, the thickness obtained from the homogeneous and isotropic modeling can even take negative and largely overestimated values, too. Therefore, experimentally obtained unrealistic adlayer values, which were dismissed previously, might be important indicators of layer structure.
url http://dx.doi.org/10.1155/2019/1762450
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