A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model
The increase in the reliability requirements of integrated circuits applied in diverse smart sensing devices and the increase in the cost of test generation and fault simulation have expanded the need for new approaches to estimate signal reliability in logic circuits, which will help trust manageme...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2018-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8379344/ |