Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs
This paper introduces novel driving methods of the pull-down unit in a gate driver circuit for enhancement- and depletion-mode a-IGZO thin-film transistors (TFTs). The proposed gate driver circuit can achieve uniform output characteristics and effectively reduce the V<sub>OUT</sub> rippl...
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doaj-49d327893be84abab24693acbd6d25582021-03-29T18:51:25ZengIEEEIEEE Journal of the Electron Devices Society2168-67342020-01-018677310.1109/JEDS.2019.29634318947924Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTsJongsu Oh0https://orcid.org/0000-0002-5309-3904Kyung-Mo Jung1Eun Kyo Jung2Jungwoo Lee3Soo-Yeon Lee4Keechan Park5https://orcid.org/0000-0002-6543-4913Jae-Hong Jeon6Yong-Sang Kim7https://orcid.org/0000-0003-2986-2686Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaDepartment of Electrical and Computer Engineering, Seoul National University, Seoul, South KoreaDepartment of Electronics Engineering, Konkuk University, Seoul, South KoreaSchool of Electronics and Information Engineering, Korea Aerospace University, Goyang, South KoreaDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaThis paper introduces novel driving methods of the pull-down unit in a gate driver circuit for enhancement- and depletion-mode a-IGZO thin-film transistors (TFTs). The proposed gate driver circuit can achieve uniform output characteristics and effectively reduce the V<sub>OUT</sub> ripple voltage because the threshold voltage (V<sub>TH</sub>) of the pull-down units is compensated regardless of the a-IGZO TFT operation characteristics (enhancement mode: positive value of V<sub>TH</sub>, depletion mode: negative value of V<sub>TH</sub>). Many groups proposed the V<sub>TH</sub> compensation method for pull-down TFTs in the gate driver circuit using a diode connection structure. However, the diode connection structure to extract the V<sub>TH</sub> value cannot be applied in the depletion-mode oxide TFTs because TFT enters the turn-on state even when the V<sub>GS</sub> value is 0 V. To solve this problem, we adopted the V<sub>TH</sub> extraction period only once in one frame time. As a result, our circuit can compensate for V<sub>TH</sub> of the pull-down unit in the enhancement mode and can be normally operated in the depletion mode. Adjunctively, two low signals (VGL1 and VGL2) and QC node were designed to prevent the leakage current path for Q and V<sub>OUT</sub> nodes. To verify the threshold voltage tolerance for various stress conditions, we demonstrated the reliability of the circuit according to the threshold voltage change of the TFTs. The simulation result shows that all the VOUT waveforms are maintained at +28 V (VGH) under the V<sub>TH</sub> shift conditions from -7 V to +11 V; further, the rising time and falling time are less than 0.62 μs and 0.96 μs, respectively. Based on a 120Hz ultra-high definition (UHD) graphics (3840×2160) display panel, the proposed circuit has uniform V<sub>OUT</sub> characteristics compared to previous V<sub>TH</sub> compensation circuit when ΔV<sub>TH</sub> changes from -3 V to +11 V. When ΔV<sub>TH</sub> changes from -4 V to -7 V, there is also no circuit malfunction, even with slight increase in the falling time and power consumption.https://ieeexplore.ieee.org/document/8947924/a-IGZO TFTgate driver circuitpull-down unitenhancement modedepletion modethreshold voltage |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Jongsu Oh Kyung-Mo Jung Eun Kyo Jung Jungwoo Lee Soo-Yeon Lee Keechan Park Jae-Hong Jeon Yong-Sang Kim |
spellingShingle |
Jongsu Oh Kyung-Mo Jung Eun Kyo Jung Jungwoo Lee Soo-Yeon Lee Keechan Park Jae-Hong Jeon Yong-Sang Kim Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs IEEE Journal of the Electron Devices Society a-IGZO TFT gate driver circuit pull-down unit enhancement mode depletion mode threshold voltage |
author_facet |
Jongsu Oh Kyung-Mo Jung Eun Kyo Jung Jungwoo Lee Soo-Yeon Lee Keechan Park Jae-Hong Jeon Yong-Sang Kim |
author_sort |
Jongsu Oh |
title |
Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs |
title_short |
Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs |
title_full |
Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs |
title_fullStr |
Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs |
title_full_unstemmed |
Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs |
title_sort |
novel driving methods of gate driver for enhancement- and depletion-mode oxide tfts |
publisher |
IEEE |
series |
IEEE Journal of the Electron Devices Society |
issn |
2168-6734 |
publishDate |
2020-01-01 |
description |
This paper introduces novel driving methods of the pull-down unit in a gate driver circuit for enhancement- and depletion-mode a-IGZO thin-film transistors (TFTs). The proposed gate driver circuit can achieve uniform output characteristics and effectively reduce the V<sub>OUT</sub> ripple voltage because the threshold voltage (V<sub>TH</sub>) of the pull-down units is compensated regardless of the a-IGZO TFT operation characteristics (enhancement mode: positive value of V<sub>TH</sub>, depletion mode: negative value of V<sub>TH</sub>). Many groups proposed the V<sub>TH</sub> compensation method for pull-down TFTs in the gate driver circuit using a diode connection structure. However, the diode connection structure to extract the V<sub>TH</sub> value cannot be applied in the depletion-mode oxide TFTs because TFT enters the turn-on state even when the V<sub>GS</sub> value is 0 V. To solve this problem, we adopted the V<sub>TH</sub> extraction period only once in one frame time. As a result, our circuit can compensate for V<sub>TH</sub> of the pull-down unit in the enhancement mode and can be normally operated in the depletion mode. Adjunctively, two low signals (VGL1 and VGL2) and QC node were designed to prevent the leakage current path for Q and V<sub>OUT</sub> nodes. To verify the threshold voltage tolerance for various stress conditions, we demonstrated the reliability of the circuit according to the threshold voltage change of the TFTs. The simulation result shows that all the VOUT waveforms are maintained at +28 V (VGH) under the V<sub>TH</sub> shift conditions from -7 V to +11 V; further, the rising time and falling time are less than 0.62 μs and 0.96 μs, respectively. Based on a 120Hz ultra-high definition (UHD) graphics (3840×2160) display panel, the proposed circuit has uniform V<sub>OUT</sub> characteristics compared to previous V<sub>TH</sub> compensation circuit when ΔV<sub>TH</sub> changes from -3 V to +11 V. When ΔV<sub>TH</sub> changes from -4 V to -7 V, there is also no circuit malfunction, even with slight increase in the falling time and power consumption. |
topic |
a-IGZO TFT gate driver circuit pull-down unit enhancement mode depletion mode threshold voltage |
url |
https://ieeexplore.ieee.org/document/8947924/ |
work_keys_str_mv |
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