Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs

This paper introduces novel driving methods of the pull-down unit in a gate driver circuit for enhancement- and depletion-mode a-IGZO thin-film transistors (TFTs). The proposed gate driver circuit can achieve uniform output characteristics and effectively reduce the V<sub>OUT</sub> rippl...

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Main Authors: Jongsu Oh, Kyung-Mo Jung, Eun Kyo Jung, Jungwoo Lee, Soo-Yeon Lee, Keechan Park, Jae-Hong Jeon, Yong-Sang Kim
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8947924/
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spelling doaj-49d327893be84abab24693acbd6d25582021-03-29T18:51:25ZengIEEEIEEE Journal of the Electron Devices Society2168-67342020-01-018677310.1109/JEDS.2019.29634318947924Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTsJongsu Oh0https://orcid.org/0000-0002-5309-3904Kyung-Mo Jung1Eun Kyo Jung2Jungwoo Lee3Soo-Yeon Lee4Keechan Park5https://orcid.org/0000-0002-6543-4913Jae-Hong Jeon6Yong-Sang Kim7https://orcid.org/0000-0003-2986-2686Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaDepartment of Electrical and Computer Engineering, Seoul National University, Seoul, South KoreaDepartment of Electronics Engineering, Konkuk University, Seoul, South KoreaSchool of Electronics and Information Engineering, Korea Aerospace University, Goyang, South KoreaDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South KoreaThis paper introduces novel driving methods of the pull-down unit in a gate driver circuit for enhancement- and depletion-mode a-IGZO thin-film transistors (TFTs). The proposed gate driver circuit can achieve uniform output characteristics and effectively reduce the V<sub>OUT</sub> ripple voltage because the threshold voltage (V<sub>TH</sub>) of the pull-down units is compensated regardless of the a-IGZO TFT operation characteristics (enhancement mode: positive value of V<sub>TH</sub>, depletion mode: negative value of V<sub>TH</sub>). Many groups proposed the V<sub>TH</sub> compensation method for pull-down TFTs in the gate driver circuit using a diode connection structure. However, the diode connection structure to extract the V<sub>TH</sub> value cannot be applied in the depletion-mode oxide TFTs because TFT enters the turn-on state even when the V<sub>GS</sub> value is 0 V. To solve this problem, we adopted the V<sub>TH</sub> extraction period only once in one frame time. As a result, our circuit can compensate for V<sub>TH</sub> of the pull-down unit in the enhancement mode and can be normally operated in the depletion mode. Adjunctively, two low signals (VGL1 and VGL2) and QC node were designed to prevent the leakage current path for Q and V<sub>OUT</sub> nodes. To verify the threshold voltage tolerance for various stress conditions, we demonstrated the reliability of the circuit according to the threshold voltage change of the TFTs. The simulation result shows that all the VOUT waveforms are maintained at +28 V (VGH) under the V<sub>TH</sub> shift conditions from -7 V to +11 V; further, the rising time and falling time are less than 0.62 &#x03BC;s and 0.96 &#x03BC;s, respectively. Based on a 120Hz ultra-high definition (UHD) graphics (3840&#x00D7;2160) display panel, the proposed circuit has uniform V<sub>OUT</sub> characteristics compared to previous V<sub>TH</sub> compensation circuit when &#x0394;V<sub>TH</sub> changes from -3 V to +11 V. When &#x0394;V<sub>TH</sub> changes from -4 V to -7 V, there is also no circuit malfunction, even with slight increase in the falling time and power consumption.https://ieeexplore.ieee.org/document/8947924/a-IGZO TFTgate driver circuitpull-down unitenhancement modedepletion modethreshold voltage
collection DOAJ
language English
format Article
sources DOAJ
author Jongsu Oh
Kyung-Mo Jung
Eun Kyo Jung
Jungwoo Lee
Soo-Yeon Lee
Keechan Park
Jae-Hong Jeon
Yong-Sang Kim
spellingShingle Jongsu Oh
Kyung-Mo Jung
Eun Kyo Jung
Jungwoo Lee
Soo-Yeon Lee
Keechan Park
Jae-Hong Jeon
Yong-Sang Kim
Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs
IEEE Journal of the Electron Devices Society
a-IGZO TFT
gate driver circuit
pull-down unit
enhancement mode
depletion mode
threshold voltage
author_facet Jongsu Oh
Kyung-Mo Jung
Eun Kyo Jung
Jungwoo Lee
Soo-Yeon Lee
Keechan Park
Jae-Hong Jeon
Yong-Sang Kim
author_sort Jongsu Oh
title Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs
title_short Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs
title_full Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs
title_fullStr Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs
title_full_unstemmed Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs
title_sort novel driving methods of gate driver for enhancement- and depletion-mode oxide tfts
publisher IEEE
series IEEE Journal of the Electron Devices Society
issn 2168-6734
publishDate 2020-01-01
description This paper introduces novel driving methods of the pull-down unit in a gate driver circuit for enhancement- and depletion-mode a-IGZO thin-film transistors (TFTs). The proposed gate driver circuit can achieve uniform output characteristics and effectively reduce the V<sub>OUT</sub> ripple voltage because the threshold voltage (V<sub>TH</sub>) of the pull-down units is compensated regardless of the a-IGZO TFT operation characteristics (enhancement mode: positive value of V<sub>TH</sub>, depletion mode: negative value of V<sub>TH</sub>). Many groups proposed the V<sub>TH</sub> compensation method for pull-down TFTs in the gate driver circuit using a diode connection structure. However, the diode connection structure to extract the V<sub>TH</sub> value cannot be applied in the depletion-mode oxide TFTs because TFT enters the turn-on state even when the V<sub>GS</sub> value is 0 V. To solve this problem, we adopted the V<sub>TH</sub> extraction period only once in one frame time. As a result, our circuit can compensate for V<sub>TH</sub> of the pull-down unit in the enhancement mode and can be normally operated in the depletion mode. Adjunctively, two low signals (VGL1 and VGL2) and QC node were designed to prevent the leakage current path for Q and V<sub>OUT</sub> nodes. To verify the threshold voltage tolerance for various stress conditions, we demonstrated the reliability of the circuit according to the threshold voltage change of the TFTs. The simulation result shows that all the VOUT waveforms are maintained at +28 V (VGH) under the V<sub>TH</sub> shift conditions from -7 V to +11 V; further, the rising time and falling time are less than 0.62 &#x03BC;s and 0.96 &#x03BC;s, respectively. Based on a 120Hz ultra-high definition (UHD) graphics (3840&#x00D7;2160) display panel, the proposed circuit has uniform V<sub>OUT</sub> characteristics compared to previous V<sub>TH</sub> compensation circuit when &#x0394;V<sub>TH</sub> changes from -3 V to +11 V. When &#x0394;V<sub>TH</sub> changes from -4 V to -7 V, there is also no circuit malfunction, even with slight increase in the falling time and power consumption.
topic a-IGZO TFT
gate driver circuit
pull-down unit
enhancement mode
depletion mode
threshold voltage
url https://ieeexplore.ieee.org/document/8947924/
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AT jungwoolee noveldrivingmethodsofgatedriverforenhancementanddepletionmodeoxidetfts
AT sooyeonlee noveldrivingmethodsofgatedriverforenhancementanddepletionmodeoxidetfts
AT keechanpark noveldrivingmethodsofgatedriverforenhancementanddepletionmodeoxidetfts
AT jaehongjeon noveldrivingmethodsofgatedriverforenhancementanddepletionmodeoxidetfts
AT yongsangkim noveldrivingmethodsofgatedriverforenhancementanddepletionmodeoxidetfts
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