Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method
A pseudo-spectral approximation is presented to solve the problem of pull-in instability in a cantilever micro-switch. As well known, pull-in instability arises when the acting force reaches a critical threshold beyond which equilibrium is no longer possible. In particular, Coulomb electrostatic for...
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2016-01-01
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Series: | Modelling and Simulation in Engineering |
Online Access: | http://dx.doi.org/10.1155/2016/8543616 |
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doaj-4746fe0f4a8a46828f714028561b9baa2020-11-24T21:52:47ZengHindawi LimitedModelling and Simulation in Engineering1687-55911687-56052016-01-01201610.1155/2016/85436168543616Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral MethodP. Di Maida0G. Bianchi1Dipartimento di Scienze e Metodi dell’Ingegneria (DISMI), Universitá degli Studi di Modena e Reggio Emilia, Via G. Amendola 2, 42122 Reggio Emilia, ItalyDipartimento di Scienze e Metodi dell’Ingegneria (DISMI), Universitá degli Studi di Modena e Reggio Emilia, Via G. Amendola 2, 42122 Reggio Emilia, ItalyA pseudo-spectral approximation is presented to solve the problem of pull-in instability in a cantilever micro-switch. As well known, pull-in instability arises when the acting force reaches a critical threshold beyond which equilibrium is no longer possible. In particular, Coulomb electrostatic force is considered, although the method can be easily generalized to account for fringe as well as Casimir effects. A numerical comparison is presented between a pseudo-spectral and a Finite Element (FE) approximation of the problem, both methods employing the same number of degrees of freedom. It is shown that the pseudo-spectral method appears more effective in accurately approximating the behavior of the cantilever near its tip. This fact is crucial to capturing the threshold voltage on the verge of pull-in. Conversely, the FE approximation presents rapid successions of attracting/repulsing regions along the cantilever, which are not restricted to the near pull-in regime.http://dx.doi.org/10.1155/2016/8543616 |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
P. Di Maida G. Bianchi |
spellingShingle |
P. Di Maida G. Bianchi Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method Modelling and Simulation in Engineering |
author_facet |
P. Di Maida G. Bianchi |
author_sort |
P. Di Maida |
title |
Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method |
title_short |
Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method |
title_full |
Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method |
title_fullStr |
Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method |
title_full_unstemmed |
Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method |
title_sort |
numerical investigation of pull-in instability in a micro-switch mems device through the pseudo-spectral method |
publisher |
Hindawi Limited |
series |
Modelling and Simulation in Engineering |
issn |
1687-5591 1687-5605 |
publishDate |
2016-01-01 |
description |
A pseudo-spectral approximation is presented to solve the problem of pull-in instability in a cantilever micro-switch. As well known, pull-in instability arises when the acting force reaches a critical threshold beyond which equilibrium is no longer possible. In particular, Coulomb electrostatic force is considered, although the method can be easily generalized to account for fringe as well as Casimir effects. A numerical comparison is presented between a pseudo-spectral and a Finite Element (FE) approximation of the problem, both methods employing the same number of degrees of freedom. It is shown that the pseudo-spectral method appears more effective in accurately approximating the behavior of the cantilever near its tip. This fact is crucial to capturing the threshold voltage on the verge of pull-in. Conversely, the FE approximation presents rapid successions of attracting/repulsing regions along the cantilever, which are not restricted to the near pull-in regime. |
url |
http://dx.doi.org/10.1155/2016/8543616 |
work_keys_str_mv |
AT pdimaida numericalinvestigationofpullininstabilityinamicroswitchmemsdevicethroughthepseudospectralmethod AT gbianchi numericalinvestigationofpullininstabilityinamicroswitchmemsdevicethroughthepseudospectralmethod |
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