Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method

A pseudo-spectral approximation is presented to solve the problem of pull-in instability in a cantilever micro-switch. As well known, pull-in instability arises when the acting force reaches a critical threshold beyond which equilibrium is no longer possible. In particular, Coulomb electrostatic for...

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Main Authors: P. Di Maida, G. Bianchi
Format: Article
Language:English
Published: Hindawi Limited 2016-01-01
Series:Modelling and Simulation in Engineering
Online Access:http://dx.doi.org/10.1155/2016/8543616
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spelling doaj-4746fe0f4a8a46828f714028561b9baa2020-11-24T21:52:47ZengHindawi LimitedModelling and Simulation in Engineering1687-55911687-56052016-01-01201610.1155/2016/85436168543616Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral MethodP. Di Maida0G. Bianchi1Dipartimento di Scienze e Metodi dell’Ingegneria (DISMI), Universitá degli Studi di Modena e Reggio Emilia, Via G. Amendola 2, 42122 Reggio Emilia, ItalyDipartimento di Scienze e Metodi dell’Ingegneria (DISMI), Universitá degli Studi di Modena e Reggio Emilia, Via G. Amendola 2, 42122 Reggio Emilia, ItalyA pseudo-spectral approximation is presented to solve the problem of pull-in instability in a cantilever micro-switch. As well known, pull-in instability arises when the acting force reaches a critical threshold beyond which equilibrium is no longer possible. In particular, Coulomb electrostatic force is considered, although the method can be easily generalized to account for fringe as well as Casimir effects. A numerical comparison is presented between a pseudo-spectral and a Finite Element (FE) approximation of the problem, both methods employing the same number of degrees of freedom. It is shown that the pseudo-spectral method appears more effective in accurately approximating the behavior of the cantilever near its tip. This fact is crucial to capturing the threshold voltage on the verge of pull-in. Conversely, the FE approximation presents rapid successions of attracting/repulsing regions along the cantilever, which are not restricted to the near pull-in regime.http://dx.doi.org/10.1155/2016/8543616
collection DOAJ
language English
format Article
sources DOAJ
author P. Di Maida
G. Bianchi
spellingShingle P. Di Maida
G. Bianchi
Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method
Modelling and Simulation in Engineering
author_facet P. Di Maida
G. Bianchi
author_sort P. Di Maida
title Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method
title_short Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method
title_full Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method
title_fullStr Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method
title_full_unstemmed Numerical Investigation of Pull-In Instability in a Micro-Switch MEMS Device through the Pseudo-Spectral Method
title_sort numerical investigation of pull-in instability in a micro-switch mems device through the pseudo-spectral method
publisher Hindawi Limited
series Modelling and Simulation in Engineering
issn 1687-5591
1687-5605
publishDate 2016-01-01
description A pseudo-spectral approximation is presented to solve the problem of pull-in instability in a cantilever micro-switch. As well known, pull-in instability arises when the acting force reaches a critical threshold beyond which equilibrium is no longer possible. In particular, Coulomb electrostatic force is considered, although the method can be easily generalized to account for fringe as well as Casimir effects. A numerical comparison is presented between a pseudo-spectral and a Finite Element (FE) approximation of the problem, both methods employing the same number of degrees of freedom. It is shown that the pseudo-spectral method appears more effective in accurately approximating the behavior of the cantilever near its tip. This fact is crucial to capturing the threshold voltage on the verge of pull-in. Conversely, the FE approximation presents rapid successions of attracting/repulsing regions along the cantilever, which are not restricted to the near pull-in regime.
url http://dx.doi.org/10.1155/2016/8543616
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AT gbianchi numericalinvestigationofpullininstabilityinamicroswitchmemsdevicethroughthepseudospectralmethod
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