Tightly binding valence electron in aluminum observed through X-ray charge density study
Abstract Accurate and high reciprocal resolution experimental structure factors of aluminum were determined from a synchrotron powder X-ray diffraction data measured at 30 K with sin θ/λ < 2.31 Å−1. The structure factors have small deviations from independent atom model in sin θ/λ < 0.83 Å −1....
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group
2018-08-01
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| Series: | Scientific Reports |
| Online Access: | https://doi.org/10.1038/s41598-018-30470-1 |