Mosaic Structure Characterization of the AlInN Layer Grown on Sapphire Substrate
The 150 nm thick, (0001) orientated wurtzite-phase Al1−xInxN epitaxial layers were grown by metal organic chemical vapor deposition on GaN (2.3 µm) template/(0001) sapphire substrate. The indium (x) concentration of the Al1−xInxN epitaxial layers was changed as 0.04, 0.18, 0.20, 0.47, and 0.48. The...
Main Authors: | Engin Arslan, Pakize Demirel, Huseyin Çakmak, Mustafa K. Öztürk, Ekmel Ozbay |
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Format: | Article |
Language: | English |
Published: |
Hindawi Limited
2014-01-01
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Series: | Advances in Materials Science and Engineering |
Online Access: | http://dx.doi.org/10.1155/2014/980639 |
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