| Summary: | Optical scatterometry is known as a powerful tool for nanostructure reconstruction due to its advantages of being non-contact, non-destructive, low cost, and easy to integrate. As a typical model-based method, it usually makes use of abundant measured data for structural profile reconstruction, on the other hand, too much redundant information significantly degrades the efficiency in profile reconstruction. We propose a method based on dependence analysis to identify and then eliminate the measurement configurations with redundant information. Our experiments demonstrated the capability of the proposed method in an optimized selection of a subset of measurement wavelengths that contained sufficient information for profile reconstruction and strikingly improved the profile reconstruction efficiency without sacrificing accuracy, compared with the primitive approach, by making use of the whole spectrum.
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