Developing modules for local storage and handling of cache memory defects information in a processor with non-volatile memory

• Main Authors: M. O. Tsoy, D. M. Alfonso
• Format: Article
• Language: English
• Published: CRI «Electronics» 2020-12-01
• Series: Радиопромышленность
• Subjects: cache memory defects; built-in self-testing; bist; bisr; redundancy; non-volatile memory; elbrus microprocessor
• Online Access: https://www.radioprom.org/jour/article/view/777

Problem statement. Due to the downsizing of technological process in microprocessor manufacturing, the number of possible manufacturing defects in the microprocessor chip increases, some types of which can only appear during the main operation of the microprocessor. The hardware implementation of the module for storing and processing information on cache memory defects of the processor with non-volatile memory is considered to neutralize such defects and, as a result, increase the number of usable microprocessors.Objective. Research of various implementation options for such a module, identification of related problems and methods for their solution, synthesis of the described implementation options using computer-aided engineering (CAD) and comparison of the obtained characteristics.Results. The implementation that occupies the smallest area on the chip, intended for implementation in the Elbrus-12C microprocessor under development, was found based on the synthesis results analysis.Practical implications. The paper describes the issues and the way of their solution, taking into account modern requirements for development to increase the number of usable processors.