BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits

A new sensor topology meant to extract figures of merit of radio-frequency analog integrated circuits (RF-ICs) was experimentally validated. Implemented in a standard 0.35 μm complementary metal-oxide-semiconductor (CMOS) technology, it comprised two blocks: a single metal-oxide-semiconductor (MOS)...

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Main Authors:	Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragones, Xavier Perpiñà, Ferran Reverter
Format:	Article
Language:	English
Published:	MDPI AG 2021-01-01
Series:	Sensors
Subjects:	CMOS thermal sensor CMOS built-in sensor CMOS integrated circuits measurement of RF CMOS circuits built-in test and measurement
Online Access:	https://www.mdpi.com/1424-8220/21/3/805

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spelling	doaj-4594b16652a54b5498d8442a7bdd93822021-01-27T00:01:00ZengMDPI AGSensors1424-82202021-01-012180580510.3390/s21030805BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF CircuitsJosep Altet0Enrique Barajas1Diego Mateo2Alexandre Billong3Xavier Aragones4Xavier Perpiñà5Ferran Reverter6Electronic Engineering Department, Universitat Politècnica de Catalunya–BarcelonaTech, 08034 Barcelona, SpainElectronic Engineering Department, Universitat Politècnica de Catalunya–BarcelonaTech, 08034 Barcelona, SpainElectronic Engineering Department, Universitat Politècnica de Catalunya–BarcelonaTech, 08034 Barcelona, SpainElectronic Engineering Department, Universitat Politècnica de Catalunya–BarcelonaTech, 08034 Barcelona, SpainElectronic Engineering Department, Universitat Politècnica de Catalunya–BarcelonaTech, 08034 Barcelona, SpainInstitute of Microelectronics of Barcelona (IMB-CNM)—CSIC, 08193 Cerdanyola del Vallés, SpainElectronic Engineering Department, Universitat Politècnica de Catalunya–BarcelonaTech, 08034 Barcelona, SpainA new sensor topology meant to extract figures of merit of radio-frequency analog integrated circuits (RF-ICs) was experimentally validated. Implemented in a standard 0.35 μm complementary metal-oxide-semiconductor (CMOS) technology, it comprised two blocks: a single metal-oxide-semiconductor (MOS) transistor acting as temperature transducer, which was placed near the circuit to monitor, and an active band-pass filter amplifier. For validation purposes, the temperature sensor was integrated with a tuned radio-frequency power amplifier (420 MHz) and MOS transistors acting as controllable dissipating devices. First, using the MOS dissipating devices, the performance and limitations of the different blocks that constitute the temperature sensor were characterized. Second, by using the heterodyne technique (applying two nearby tones) to the power amplifier (PA) and connecting the sensor output voltage to a low-cost AC voltmeter, the PA’s output power and its central frequency were monitored. As a result, this topology resulted in a low-cost approach, with high linearity and sensitivity, for RF-IC testing and variability monitoring.https://www.mdpi.com/1424-8220/21/3/805CMOS thermal sensorCMOS built-in sensorCMOS integrated circuitsmeasurement of RF CMOS circuitsbuilt-in test and measurement
collection	DOAJ
language	English
format	Article
sources	DOAJ
author	Josep Altet Enrique Barajas Diego Mateo Alexandre Billong Xavier Aragones Xavier Perpiñà Ferran Reverter
spellingShingle	Josep Altet Enrique Barajas Diego Mateo Alexandre Billong Xavier Aragones Xavier Perpiñà Ferran Reverter BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits Sensors CMOS thermal sensor CMOS built-in sensor CMOS integrated circuits measurement of RF CMOS circuits built-in test and measurement
author_facet	Josep Altet Enrique Barajas Diego Mateo Alexandre Billong Xavier Aragones Xavier Perpiñà Ferran Reverter
author_sort	Josep Altet
title	BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits
title_short	BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits
title_full	BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits
title_fullStr	BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits
title_full_unstemmed	BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits
title_sort	bpf-based thermal sensor circuit for on-chip testing of rf circuits
publisher	MDPI AG
series	Sensors
issn	1424-8220
publishDate	2021-01-01
description	A new sensor topology meant to extract figures of merit of radio-frequency analog integrated circuits (RF-ICs) was experimentally validated. Implemented in a standard 0.35 μm complementary metal-oxide-semiconductor (CMOS) technology, it comprised two blocks: a single metal-oxide-semiconductor (MOS) transistor acting as temperature transducer, which was placed near the circuit to monitor, and an active band-pass filter amplifier. For validation purposes, the temperature sensor was integrated with a tuned radio-frequency power amplifier (420 MHz) and MOS transistors acting as controllable dissipating devices. First, using the MOS dissipating devices, the performance and limitations of the different blocks that constitute the temperature sensor were characterized. Second, by using the heterodyne technique (applying two nearby tones) to the power amplifier (PA) and connecting the sensor output voltage to a low-cost AC voltmeter, the PA’s output power and its central frequency were monitored. As a result, this topology resulted in a low-cost approach, with high linearity and sensitivity, for RF-IC testing and variability monitoring.
topic	CMOS thermal sensor CMOS built-in sensor CMOS integrated circuits measurement of RF CMOS circuits built-in test and measurement
url	https://www.mdpi.com/1424-8220/21/3/805
work_keys_str_mv	AT josepaltet bpfbasedthermalsensorcircuitforonchiptestingofrfcircuits AT enriquebarajas bpfbasedthermalsensorcircuitforonchiptestingofrfcircuits AT diegomateo bpfbasedthermalsensorcircuitforonchiptestingofrfcircuits AT alexandrebillong bpfbasedthermalsensorcircuitforonchiptestingofrfcircuits AT xavieraragones bpfbasedthermalsensorcircuitforonchiptestingofrfcircuits AT xavierperpina bpfbasedthermalsensorcircuitforonchiptestingofrfcircuits AT ferranreverter bpfbasedthermalsensorcircuitforonchiptestingofrfcircuits
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BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits

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