Optical Detection of Protrusive Defects on a Thin-Film Transistor

Protrusive defects on the color filter of thin-film transistor (TFT) liquid crystal displays (LCDs) frequently damage the valuable photomask. A fast method using side-view illuminations with digital charge-coupled devices (CCDs) that filter out ultraviolet (UV)<sub>490 nm</sub> was devel...

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Bibliographic Details
Main Authors: Fu-Ming Tzu, Jung-Shun Chen, Jung-Hua Chou
Format: Article
Language:English
Published: MDPI AG 2018-11-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/8/12/440