3D Plant Cell Architecture of Arabidopsis thaliana (Brassicaceae) Using Focused Ion Beam–Scanning Electron Microscopy

Premise of the study: Focused ion beam&#8211;scanning electron microscopy (FIB-SEM) combines the ability to sequentially mill the sample surface and obtain SEM images that can be used to create 3D renderings with micron-level resolution. We have applied FIB-SEM to study <i>Arabidopsis</...

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Bibliographic Details
Main Authors: Bhawana, Joyce L. Miller, A. Bruce Cahoon
Format: Article
Language:English
Published: Wiley 2014-06-01
Series:Applications in Plant Sciences
Subjects:
Online Access:http://www.bioone.org/doi/full/10.3732/apps.1300090