3D Plant Cell Architecture of Arabidopsis thaliana (Brassicaceae) Using Focused Ion Beam–Scanning Electron Microscopy
Premise of the study: Focused ion beam–scanning electron microscopy (FIB-SEM) combines the ability to sequentially mill the sample surface and obtain SEM images that can be used to create 3D renderings with micron-level resolution. We have applied FIB-SEM to study <i>Arabidopsis</...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
Wiley
2014-06-01
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Series: | Applications in Plant Sciences |
Subjects: | |
Online Access: | http://www.bioone.org/doi/full/10.3732/apps.1300090 |